摘要:
A memory circuit includes at least one memory cell for storing a charge representative of a datum. The memory cell is coupled with a word line and a first bit line. At least one bit line equalization transistor is coupled between the first bit line and a second bit line. A bit line equalization circuit is coupled with the bit line equalization transistor. The bit line equalization circuit is configured for providing a pulse to the bit line equalization transistor to substantially equalize voltages of the first bit line and the second bit line during a standby period before an access cycle of the memory cell.
摘要:
A memory circuit includes at least one memory cell for storing a charge representative of a datum. The memory cell is coupled with a word line and a first bit line. At least one bit line equalization transistor is coupled between the first bit line and a second bit line. A bit line equalization circuit is coupled with the bit line equalization transistor. The bit line equalization circuit is configured for providing a pulse to the bit line equalization transistor to substantially equalize voltages of the first bit line and the second bit line during a standby period before an access cycle of the memory cell.
摘要:
A semiconductor memory includes a memory array having memory cells coupled to wordlines and bitlines. Each wordline has a left end and an opposing right end. A first wordline in every two adjacent wordlines has its left end connected to a left row driver and its right end connected to a right clamp circuit, and a second wordline in every two adjacent wordlines has its right end connected to a right row driver and its left end connected to a left clamp circuit, such that when the right clamp circuits are activated, the right clamp circuits clamp the corresponding wordline ends to a predetermined potential, and when the left clamp circuits are activated, the left clamp circuits clamp the corresponding wordline ends to the predetermined potential.
摘要:
A semiconductor memory includes a memory array having memory cells coupled to wordlines and bitlines. Each wordline has a left end and an opposing right end. A first wordline in every two adjacent wordlines has its left end connected to a left row driver and its right end connected to a right clamp circuit, and a second wordline in every two adjacent wordlines has its right end connected to a right row driver and its left end connected to a left clamp circuit, such that when the right clamp circuits are activated, the right clamp circuits clamp the corresponding wordline ends to a predetermined potential, and when the left clamp circuits are activated, the left clamp circuits clamp the corresponding wordline ends to the predetermined potential.
摘要:
A semiconductor memory includes a circuit block that is configured to receive a test mode command, a first sense amplifier that is coupled to sense and amplify a state of a first memory cell when enabled, and a second sense amplifier that is coupled to sense and amplify a state of a second memory cell when enabled. In an active cycle, the circuit block generates one or more control signals in response to the test mode command that cause the second sense amplifier to be enabled a predetermined amount of time after the first sense amplifier is enabled.
摘要:
A semiconductor memory includes a circuit block that is configured to receive a test mode command, a first sense amplifier that is coupled to sense and amplify a state of a first memory cell when enabled, and a second sense amplifier that is coupled to sense and amplify a state of a second memory cell when enabled. In an active cycle, the circuit block generates one or more control signals in response to the test mode command that cause the second sense amplifier to be enabled a predetermined amount of time after the first sense amplifier is enabled.
摘要:
Circuit and method for a gate control output circuit having reduced voltage stress on the devices is disclosed. In a circuit of MOS transistors for supplying an output to control a transfer gate, the output having a high voltage level that exceeds a supply voltage, first and second clamping circuits are provided. The first clamping circuit ensures a voltage between the gate and the source/drain and drain/source of a PMOS transistor that couples a pumped voltage to the output does not exceed a predetermined voltage. The second clamping circuit ensures that the voltage between the gate of an NMOS transistor and the output which is coupled to the drain/source of the NMOS transistor does not exceed a predetermined amount. The clamping circuits prevent gate stress problems on the transistors by ensuring the voltages between the gates and the source/drain and drain/source terminals do not exceed predetermined voltages.