利索-全球专利检索

  1. 登录
  2. 注册

搜索结果

4 条记录 (耗时 0.013 秒)

    Probe card
    1.
    发明授权
    Probe card 失效
    探针卡

    公开(公告)号：US08723545B2

    公开(公告)日：2014-05-13

    申请号：US13286858

    申请日：2011-11-01

    申请人： Duk Kyu Lee ,  Chang Min Im ,  Sang Bum Sim ,  Yun Kee Cho

    发明人： Duk Kyu Lee ,  Chang Min Im ,  Sang Bum Sim ,  Yun Kee Cho

    IPC分类号： G01R31/00

    CPC分类号： G01R1/07378

    摘要： A probe card facilitates a wiring connection, reducing working time and preventing a working error and includes a main circuit board having an opening in its center. A reinforcement member has a lower end coupled to that opening to prevent deforming the board. A sub-circuit board electrically connected to the main board is seated on an upper side of the reinforcement member. A space transformer is positioned on a lower portion of the opening of the main board. A plurality of wires have both ends inserted into through holes in the sub-circuit board and space transformer to electrically connect them. Probes are provided on a lower portion of the space transformer, each having one end in contact with the wire inserted into the through-hole of the space transformer and the other end in contact with a wafer to be tested.

    摘要翻译： 探针卡有助于接线连接，减少工作时间并防止工作错误，并且包括在其中心具有开口的主电路板。 加强构件具有联接到该开口的下端，以防止板的变形。 电连接到主板的子电路板位于加强构件的上侧。 空间变压器位于主板的开口的下部。 多根导线的两端插入到副电路板和空间变压器的通孔中，以将它们电连接。 探针设置在空间变压器的下部，每个探针的一端与插入空间变压器的通孔的导线接触，另一端与待测试的晶片接触。

    Probe Card
    2.
    发明申请
    Probe Card 失效
    探头卡

    公开(公告)号：US20120146677A1

    公开(公告)日：2012-06-14

    申请号：US13286858

    申请日：2011-11-01

    申请人： Duk Kyu Lee ,  Chang Min Im ,  Sang Bum Sim ,  Yun Kee Cho

    发明人： Duk Kyu Lee ,  Chang Min Im ,  Sang Bum Sim ,  Yun Kee Cho

    IPC分类号： G01R1/067

    CPC分类号： G01R1/07378

    摘要： A probe card facilitates a wiring connection, reducing working time and preventing a working error and includes a main circuit board having an opening in its center. A reinforcement member has a lower end coupled to that opening to prevent deforming the board. A sub-circuit board electrically connected to the main board is seated on an upper side of the reinforcement member. A space transformer is positioned on a lower portion of the opening of the main board. A plurality of wires have both ends inserted into through holes in the sub-circuit board and space transformer to electrically connect them. Probes are provided on a lower portion of the space transformer, each having one end in contact with the wire inserted into the through-hole of the space transformer and the other end in contact with a wafer to be tested.

    摘要翻译： 探针卡有助于接线连接，减少工作时间并防止工作错误，并且包括在其中心具有开口的主电路板。 加强构件具有联接到该开口的下端，以防止板的变形。 电连接到主板的子电路板位于加强构件的上侧。 空间变压器位于主板的开口的下部。 多根导线的两端插入到副电路板和空间变压器的通孔中，以将它们电连接。 探针设置在空间变压器的下部，每个探针的一端与插入空间变压器的通孔的导线接触，另一端与待测试的晶片接触。