Corona based charge voltage measurement
    1.
    发明授权
    Corona based charge voltage measurement 有权
    基于电晕的充电电压测量

    公开(公告)号:US07345306B1

    公开(公告)日:2008-03-18

    申请号:US11421855

    申请日:2006-06-02

    IPC分类号: H01L23/58

    摘要: A method of measuring electrical characteristics of a gate dielectric. The gate dielectric is local annealed by directing a highly localized energy source at the measurement area, such that the measurement area is brought to an annealing temperature while surrounding structures are not significantly heated. While heating the measurement area, a flow of a gas containing a percentage of hydrogen, deuterium, or water vapor at a flow rate is directed to the measurement area. A charge is inducted on the measurement area and the electrical characteristics of the gate dielectric are measured using non contact electrical probing.

    摘要翻译: 测量栅极电介质的电特性的方法。 栅极电介质通过在测量区域处引导高度局部化的能量源进行局部退火,使得测量区域达到退火温度,而周围结构不被显着加热。 在加热测量区域的同时,以一定的流量将含有一定百分比的氢,氘或水蒸汽的气体流动到测量区域。 在测量区域上引入电荷,并且使用非接触电探测来测量栅极电介质的电特性。

    Corona based charge voltage measurement
    2.
    发明授权
    Corona based charge voltage measurement 有权
    基于电晕的充电电压测量

    公开(公告)号:US07098050B1

    公开(公告)日:2006-08-29

    申请号:US10974270

    申请日:2004-10-27

    IPC分类号: H01L31/26

    摘要: A method of measuring electrical characteristics of a gate dielectric. The gate dielectric is local annealed by directing a highly localized energy source at the measurement area, such that the measurement area is brought to an annealing temperature while surrounding structures are not significantly heated. While heating the measurement area, a flow of a gas containing a percentage of hydrogen, deuterium, or water vapor at a flow rate is directed to the measurement area. A charge is inducted on the measurement area and the electrical characteristics of the gate dielectric are measured using non contact electrical probing.

    摘要翻译: 测量栅极电介质的电特性的方法。 栅极电介质通过在测量区域处引导高度局部化的能量源进行局部退火,使得测量区域达到退火温度,而周围结构不被显着加热。 在加热测量区域的同时,以一定的流量将含有一定百分比的氢,氘或水蒸汽的气体流动到测量区域。 在测量区域上引入电荷,并且使用非接触电探测来测量栅极电介质的电特性。