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公开(公告)号:US08518798B2
公开(公告)日:2013-08-27
申请号:US12888454
申请日:2010-09-23
申请人: Eric Graetz
发明人: Eric Graetz
IPC分类号: H01L21/30
CPC分类号: H01L29/06 , H01L21/76256
摘要: One or more embodiments relate to a method for forming a semiconductor structure, including: forming a semiconductor layer; and forming a dielectric layer over a back side of said semiconductor layer. In one or more embodiments, the dielectric layer may be a silicone rubber layer.
摘要翻译: 一个或多个实施例涉及一种用于形成半导体结构的方法,包括:形成半导体层; 以及在所述半导体层的背面上形成介电层。 在一个或多个实施例中,电介质层可以是硅橡胶层。
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公开(公告)号:US20130299871A1
公开(公告)日:2013-11-14
申请号:US13471453
申请日:2012-05-14
申请人: Anton MAUDER , Eric GRAETZ
发明人: Anton MAUDER , Eric GRAETZ
IPC分类号: H01L27/082 , H01L21/331 , H01L29/739
CPC分类号: H01L29/7394 , H01L27/082 , H01L27/12
摘要: Representative implementations of devices and techniques provide a high-voltage device on a semiconductor substrate. An insulating polymer layer is formed on an opposite surface to the high-voltage device, the insulating polymer layer having a thickness of at least twice that of the semiconductor substrate.
摘要翻译: 器件和技术的代表性实现在半导体衬底上提供高电压器件。 绝缘聚合物层形成在与高电压器件相对的表面上,绝缘聚合物层的厚度至少为半导体衬底的厚度的两倍。
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公开(公告)号:US20120074517A1
公开(公告)日:2012-03-29
申请号:US12888454
申请日:2010-09-23
申请人: Eric GRAETZ
发明人: Eric GRAETZ
CPC分类号: H01L29/06 , H01L21/76256
摘要: One or more embodiments relate to a method for forming a semiconductor structure, including: forming a semiconductor layer; and forming a dielectric layer over a back side of said semiconductor layer. In one or more embodiments, the dielectric layer may be a silicone rubber layer.
摘要翻译: 一个或多个实施例涉及一种用于形成半导体结构的方法,包括:形成半导体层; 以及在所述半导体层的背面上形成介电层。 在一个或多个实施例中,电介质层可以是硅橡胶层。
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公开(公告)号:US08835978B2
公开(公告)日:2014-09-16
申请号:US13471453
申请日:2012-05-14
申请人: Anton Mauder , Eric Graetz
发明人: Anton Mauder , Eric Graetz
IPC分类号: H01L29/66
CPC分类号: H01L29/7394 , H01L27/082 , H01L27/12
摘要: Representative implementations of devices and techniques provide a high-voltage device on a semiconductor substrate. An insulating polymer layer is formed on an opposite surface to the high-voltage device, the insulating polymer layer having a thickness of at least twice that of the semiconductor substrate.
摘要翻译: 器件和技术的代表性实现在半导体衬底上提供高电压器件。 绝缘聚合物层形成在与高电压器件相对的表面上,绝缘聚合物层的厚度至少为半导体衬底的厚度的两倍。
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