公开(公告)号：US4626088A

公开(公告)日：1986-12-02

申请号：US683389

申请日：1984-12-19

申请人： Christian Joncour ,  Alain Pierre ,  Patrice Renan ,  Jean-Louis Roumegoux ,  Francoise Richard, deceased ,  by Jacques M. G. Richard, heir ,  Alexandra A. C. Richard, heir ,  Anne-Lise P. M. Richard, heir

发明人： Christian Joncour ,  Alain Pierre ,  Patrice Renan ,  Jean-Louis Roumegoux ,  Francoise Richard, deceased ,  by Jacques M. G. Richard, heir ,  Alexandra A. C. Richard, heir ,  Anne-Lise P. M. Richard, heir

IPC分类号： A61B3/11 ,  G02C13/00 ,  A61B3/10

CPC分类号： A61B3/111 ,  G02C13/005

摘要： A device for measuring a subject's ocular parameters, in particular the interpupillary distance, comprises a front plate against which the face of the subject is placed, comprising two windows substantially corresponding to the lenses of a pair of eyeglasses. A lens is movable along its optical axis, which is perpendicular to the front plate, from an origin position near the front plate. A viewing eyepiece is disposed at the focus of the lens when in the origin position. A semi-reflecting mirror disposed at 45.degree. renders the eyepiece and a point source coincident, as far as the subject is concerned. Parallel to the semi-reflecting mirror, another mirror reflects an image of a cathode ray tube screen to the eyepiece through another lens. Adjustable calibrated voltage sources are used to produce coincidence of the reflections of the source on the corneas of the eyes of the subject and the luminous traces on the screen of the cathode ray tube, as seen by an operator looking through the eyepiece. These traces constitute graticules, and the voltages which generate them constitute basic measurements of the ocular parameters. The appropriate calculations are implemented by a microprocessor.

摘要翻译： 用于测量被摄体的眼睛参数，特别是瞳孔间距离的装置包括被放置对象的脸部的前板，包括基本对应于一对眼镜的镜片的两个窗口。 透镜可以沿着与其前端板垂直的光轴从前板附近的原点位置移动。 当在原点位置时，观察目镜设置在透镜的焦点处。 设置在45度的半反射镜使目镜和点光源重合，就目标而言。 与半反射镜平行，另一个镜子通过另一透镜将阴极射线管屏幕的图像反射到目镜。 使用可调校准电压源来产生源于受试者眼睛和阴极射线管屏幕上的发光迹线的源的反射的一致性，如通过目镜观察的操作者所见。 这些迹线构成刻度，产生它们的电压构成了眼睛参数的基本测量。 适当的计算由微处理器实现。