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公开(公告)号:US5274959A
公开(公告)日:1994-01-04
申请号:US990001
申请日:1992-12-11
申请人: Lawrence D. Dyer , Anthony E. Stephens , Frank Allen , Keith M. Easton , James A. Kennon , Jerry B. Medders , Frederick O. Meyer, III
发明人: Lawrence D. Dyer , Anthony E. Stephens , Frank Allen , Keith M. Easton , James A. Kennon , Jerry B. Medders , Frederick O. Meyer, III
CPC分类号: B24B9/065
摘要: A system and method for polishing the edges of a plurality of semiconductor wafers rotates a stack of wafers against a polish one or more pads such that both the wafer edges and the sides of the edges are polished to a mirror finish. The polish pad has a series of grooves through which the wafer edges are passed to polish the sides of the wafer edges, or two pads are used, one with grooves and one without grooves.
摘要翻译: 用于抛光多个半导体晶片的边缘的系统和方法使一叠晶片相对抛光一个或多个焊盘旋转,使得晶片边缘和边缘的两侧被抛光成镜面光洁度。 抛光垫具有一系列凹槽,晶片边缘通过该沟槽抛光晶片边缘的侧面,或者使用两个焊盘,一个具有凹槽,一个没有凹槽。
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公开(公告)号:US5128281A
公开(公告)日:1992-07-07
申请号:US711468
申请日:1991-06-05
申请人: Lawrence D. Dyer , Anthony E. Stephens , Frank Allen , Keith M. Easton , James A. Kennon , Jerry B. Medders , Frederick O. Meyer, III
发明人: Lawrence D. Dyer , Anthony E. Stephens , Frank Allen , Keith M. Easton , James A. Kennon , Jerry B. Medders , Frederick O. Meyer, III
IPC分类号: B24B37/02 , B24B9/00 , B24B9/06 , H01L21/304
CPC分类号: B24B9/065
摘要: A method for polishing the edges of a plurality of semiconductor wafers rotates a stack of wafers against a polish one or more pads such that both the wafer edges and the sides of the edges are polished to a mirror finish. The polish pad has a series of grooves through which the wafer edges are passed to polish the sides of the wafer edges, or two pads are used, one with grooves and one without grooves.
摘要翻译: 用于抛光多个半导体晶片的边缘的方法将一叠晶片相对于抛光一个或多个焊盘旋转,使得晶片边缘和边缘的两侧被抛光成镜面光洁度。 抛光垫具有一系列凹槽,晶片边缘通过该沟槽抛光晶片边缘的侧面,或者使用两个焊盘,一个具有凹槽,一个没有凹槽。
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