公开(公告)号：US07230245B2

公开(公告)日：2007-06-12

申请号：US11121385

申请日：2005-05-04

Applicant: Xi-Cheng Zhang ,  Tao Yuan ,  Jingzhou Xu ,  Haewook Han

Inventor： Xi-Cheng Zhang ,  Tao Yuan ,  Jingzhou Xu ,  Haewook Han

IPC: G01J5/02

CPC classification number: G01Q60/12 ,  G01N21/3563 ,  G01N21/3581

Abstract: A device for use with a source of radiation to provide a THz emission image representing a sample. The device comprises a substrate, a metallic probe having a tip adjacent to the substrate surface and a source of AC bias coupled between the probe tip and substrate. Radiation generated by the source of radiation is incident on the substrate surface in the vicinity of the probe tip and generates THz emission based at least on the AC bias coupled between the probe tip and substrate. A method for providing a THz emission image representing a sample is also provided.

Abstract translation: 一种与辐射源一起使用以提供表示样品的THz发射图像的装置。 该器件包括衬底，具有与衬底表面相邻的尖端的金属探针和耦合在探针尖端和衬底之间的AC偏压源。 由辐射源产生的辐射入射到探针尖端附近的衬底表面上，并且至少基于耦合在探针尖端和衬底之间的AC偏压产生THz发射。 还提供了一种用于提供表示样本的THz发射图像的方法。

公开(公告)号：US20060022141A1

公开(公告)日：2006-02-02

申请号：US11121385

申请日：2005-05-04

Applicant: Xi-Cheng Zhang ,  Tao Yuan ,  Jingzhou Xu ,  Haewook Han

Inventor： Xi-Cheng Zhang ,  Tao Yuan ,  Jingzhou Xu ,  Haewook Han

IPC: G01J5/02

CPC classification number: G01Q60/12 ,  G01N21/3563 ,  G01N21/3581

Abstract: A device for use with a source of radiation to provide a THz emission image representing a sample. The device comprises a substrate, a metallic probe having a tip adjacent to the substrate surface and a source of AC bias coupled between the probe tip and substrate. Radiation generated by the source of radiation is incident on the substrate surface in the vicinity of the probe tip and generates THz emission based at least on the AC bias coupled between the probe tip and substrate. A method for providing a THz emission image representing a sample is also provided.

Abstract translation: 一种与辐射源一起使用以提供表示样品的THz发射图像的装置。 该器件包括衬底，具有与衬底表面相邻的尖端的金属探针和耦合在探针尖端和衬底之间的AC偏压源。 由辐射源产生的辐射入射到探针尖端附近的衬底表面上，并且至少基于耦合在探针尖端和衬底之间的AC偏压产生THz发射。 还提供了一种用于提供表示样本的THz发射图像的方法。