Light measuring apparatus for quantifying photons
    2.
    发明授权
    Light measuring apparatus for quantifying photons 失效
    用于量子光子的光测量装置

    公开(公告)号:US5715049A

    公开(公告)日:1998-02-03

    申请号:US748837

    申请日:1996-11-14

    CPC分类号: G01J11/00

    摘要: When incident light is incident to a photodetector, photoelectrons are emitted therefrom and then multiplied to output an electric current signal. This current signal is integrated over a predetermined period of time in an integrator to be converted to a voltage signal. This voltage signal is converted to a digital signal by an AD converter. This digital signal is supplied to a histogramming memory, which generates a pulse height distribution of voltage signal. Based on a pulse height distribution N(h) generated with incidence of measurement-object light to the photodetector, a pulse height distribution of single photoelectron events p.sub.1 (h) generated by a generator of pulse height distribution of single photoelectron events, and pulse height distributions of k-photoelectron events p.sub.k (h) (k=2, 3, . . . ) calculated and generated in a generator of pulse height distributions of k-photoelectron events, an estimating unit estimates a distribution of numbers of photoelectrons emitted with incidence of the measurement-object light to the photodetector, and thereby obtains the intensity of the measurement-object light.

    摘要翻译: 当入射光入射到光检测器时,从其发射光电子,然后相乘以输出电流信号。 该电流信号在积分器中在预定时间段内积分以被转换成电压信号。 该电压信号由AD转换器转换为数字信号。 该数字信号被提供给直方图存储器,其产生电压信号的脉冲高度分布。 基于通过测量对象光入射到光电检测器产生的脉冲高度分布N(h),由单个光电子事件的脉冲高度分布的发生器产生的单个光电子事件p1(h)的脉冲高度分布和脉冲高度 在k光电子事件的脉冲高度分布的发生器中计算和产生的k光电子事件pk(h)(k = 2,3,...)的分布,估计单元估计发射的光电子数量的分布 的测量对象光,并且由此获得测量对象光的强度。

    Light measuring apparatus for quantizing photon
    3.
    发明授权
    Light measuring apparatus for quantizing photon 失效
    用于量子化的光测量装置

    公开(公告)号:US5694211A

    公开(公告)日:1997-12-02

    申请号:US767933

    申请日:1996-12-17

    IPC分类号: G01J1/42 G01N21/64

    CPC分类号: G01J1/42 G01N21/64

    摘要: When incident light is incident to a photodetector, photoelectrons are emitted and multiplied in each of incident zones whereby a plurality of current signals are output. These current signals each are processed to estimate a distribution or a mean value of numbers of photoelectrons generated in each incident zone. Then estimated based on the estimate values of respective incident zones is the number of photoelectrons emitted from the entire photoelectric conversion surface. In this way the intensity of incident light is measured with accuracy.

    摘要翻译: 当入射光入射到光电检测器时,光电子被发射并在每个入射区域中相乘,从而输出多个电流信号。 每个这些电流信号被处理以估计在每个入射区域中产生的光电子数量的分布或平均值。 然后,基于各入射区域的估计值估计是从整个光电转换表面发射的光电子的数量。 以这种方式,准确地测量入射光的强度。