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公开(公告)号：US20120140059A1
公开(公告)日：2012-06-07
申请号：US13039276
申请日：2011-03-02
IPC分类号： H04N7/18
CPC分类号： G01J1/0252 , G01J1/4228 , G01J2001/4252 , G01R31/2635 , G01R31/2893
摘要： An inspection machine capable of inspecting optical property and electrical property of a light emitting device is provided. The inspection machine includes a substrate table, a probe mechanism, a heating apparatus, a cooling apparatus, an image-sensing apparatus, a temperature-sensing apparatus and a moving mechanism. The probe mechanism is capable of moving toward the light emitting device to contact therewith. The heating apparatus is capable of heating the light emitting device within a first temperature range. The cooling apparatus is capable of cooling the light emitting device within a second temperature range. The image-sensing apparatus senses a light emitting image provided from the light emitting device. The temperature-sensing apparatus senses the present temperature of the light emitting device. The image-sensing apparatus is disposed on the moving mechanism. The moving mechanism is capable of moving the image-sensing apparatus. An inspecting method and an inspecting system for the inspection machine are also provided.
摘要翻译： 提供了能够检查发光装置的光学特性和电气性能的检查机。 检查机包括基板台，探针机构，加热装置，冷却装置，图像感测装置，温度感测装置和移动机构。 探针机构能够向发光器件移动以与其接触。 加热装置能够在第一温度范围内加热发光装置。 冷却装置能够在第二温度范围内冷却发光装置。 图像感测装置感测从发光装置提供的发光图像。 温度感测装置感测发光装置的当前温度。 图像感测装置设置在移动机构上。 移动机构能够移动图像感测装置。 还提供了检验机的检查方法和检查系统。
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公开(公告)号：US08421858B2
公开(公告)日：2013-04-16
申请号：US13039276
申请日：2011-03-02
CPC分类号： G01J1/0252 , G01J1/4228 , G01J2001/4252 , G01R31/2635 , G01R31/2893
摘要： An inspection machine capable of inspecting optical property and electrical property of a light emitting device is provided. The inspection machine includes a substrate table, a probe mechanism, a heating apparatus, a cooling apparatus, an image-sensing apparatus, a temperature-sensing apparatus and a moving mechanism. The probe mechanism is capable of moving toward the light emitting device to contact therewith. The heating apparatus is capable of heating the light emitting device within a first temperature range. The cooling apparatus is capable of cooling the light emitting device within a second temperature range. The image-sensing apparatus senses a light emitting image provided from the light emitting device. The temperature-sensing apparatus senses the present temperature of the light emitting device. The image-sensing apparatus is disposed on the moving mechanism. The moving mechanism is capable of moving the image-sensing apparatus. An inspecting method and an inspecting system for the inspection machine are also provided.
摘要翻译： 提供了能够检查发光装置的光学特性和电气性能的检查机。 检查机包括基板台，探针机构，加热装置，冷却装置，图像感测装置，温度感测装置和移动机构。 探针机构能够向发光器件移动以与其接触。 加热装置能够在第一温度范围内加热发光装置。 冷却装置能够在第二温度范围内冷却发光装置。 图像感测装置感测从发光装置提供的发光图像。 温度感测装置感测发光装置的当前温度。 图像感测装置设置在移动机构上。 移动机构能够移动图像感测装置。 还提供了检验机的检查方法和检查系统。
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