Computer aided inspection machine
    1.
    发明授权
    Computer aided inspection machine 失效
    计算机辅助检验机

    公开(公告)号:US6064759A

    公开(公告)日:2000-05-16

    申请号:US965542

    申请日:1997-11-06

    CPC classification number: G01B11/024

    Abstract: An automatic inspection method and apparatus using structured light and machine vision cameras to inspect an object in conjunction with the geometric model of the object is disclosed. Camera images of the object are analyzed by computer to produce the location of points on the object's surfaces in three dimensions. During a setup phase before object inspection, the points are analyzed with respect to the geometric model computer file of the object. Many points are eliminated to reduce data-taking and analysis time to a minimum and to prevent extraneous reflections from producing errors. When similar objects are subsequently inspected, points from each surface of interest are spatially averaged to give high accuracy measurements of object dimensions. The inspection device uses several multiplexed sensors, each composed of a camera and a structured light source, to measure all sides of the object on a single pass. Calibration and compensation methods are also disclosed.

    Abstract translation: 公开了一种使用结构光和机器视觉摄像机结合物体的几何模型来检查物体的自动检查方法和装置。 计算机分析对象的相机图像,以在三维上产生物体表面上的点的位置。 在对象检查之前的设置阶段,对对象的几何模型计算机文件进行分析。 消除了许多观点,将数据采集和分析时间降至最低,并防止外部反射产生错误。 当随后检查相似的物体时,来自每个感兴趣的表面的点在空间上被平均以给出对象尺寸的高精度测量。 检查装置使用多个传感器,每个传感器由相机和结构化光源组成,用于单次测量物体的所有侧面。 还公开了校准和补偿方法。

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