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公开(公告)号：US07151368B2
公开(公告)日：2006-12-19
申请号：US11243458
申请日：2005-10-03
CPC分类号： G01R1/0408 , G01R1/0466 , G01R1/0483
摘要： The present invention relates to an insert block for testing semiconductor devices. The insert block comprises one or more pushers, installed in a block body having a loading space to accommodate a semiconductor device under test, including a first push rod to apply force to one of adjacent sides of the semiconductor device under test and a second push rod to apply force to the other thereof.Accordingly, firm centering of semiconductor devices under test relative to the contact pins of the test socket along the two perpendicular axes (for instance, x and y axes) on the top or bottom surface of the semiconductor device is achieved and leads to the proper interfaces between the external terminals of the semiconductor device under test and the contact pins of the test socket, and thereby improves the quality of connection therebetween.
摘要翻译： 本发明涉及一种用于测试半导体器件的插入块。 插入块包括一个或多个推动器，其安装在具有装载空间以容纳被测半导体器件的块体中，包括第一推杆，以对被测半导体器件的相邻侧之一施加力;第二推杆 向另一方施加力量。 因此，实现半导体器件的顶部或底部表面上沿着两个垂直轴（例如x和y轴）测试的半导体器件相对于测试插座的接触针的牢固定心，并且导致适当的接口 在被测半导体器件的外部端子和测试插座的接触引脚之间，从而提高其间的连接质量。
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公开(公告)号：US20060071656A1
公开(公告)日：2006-04-06
申请号：US11243458
申请日：2005-10-03
IPC分类号： G01R31/28
CPC分类号： G01R1/0408 , G01R1/0466 , G01R1/0483
摘要： The present invention relates to an insert block for testing semiconductor devices. The insert block comprises one or more pushers, installed in a block body having a loading space to accommodate a semiconductor device under test, including a first push rod to apply force to one of adjacent sides of the semiconductor device under test and a second push rod to apply force to the other thereof. Accordingly, firm centering of semiconductor devices under test relative to the contact pins of the test socket along the two perpendicular axes (for instance, x and y axes) on the top or bottom surface of the semiconductor device is achieved and leads to the proper interfaces between the external terminals of the semiconductor device under test and the contact pins of the test socket, and thereby improves the quality of connection therebetween.
摘要翻译： 本发明涉及一种用于测试半导体器件的插入块。 插入块包括一个或多个推动器，其安装在具有装载空间以容纳被测半导体器件的块体中，包括第一推杆，以对被测半导体器件的相邻侧之一施加力;第二推杆 向另一方施加力量。 因此，实现半导体器件的顶部或底部表面上沿着两个垂直轴（例如x和y轴）测试的半导体器件相对于测试插座的接触针的牢固定心，并且导致适当的接口 在被测半导体器件的外部端子和测试插座的接触引脚之间，从而提高其间的连接质量。
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