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公开(公告)号：US07151368B2
公开(公告)日：2006-12-19
申请号：US11243458
申请日：2005-10-03
CPC分类号： G01R1/0408 , G01R1/0466 , G01R1/0483
摘要： The present invention relates to an insert block for testing semiconductor devices. The insert block comprises one or more pushers, installed in a block body having a loading space to accommodate a semiconductor device under test, including a first push rod to apply force to one of adjacent sides of the semiconductor device under test and a second push rod to apply force to the other thereof.Accordingly, firm centering of semiconductor devices under test relative to the contact pins of the test socket along the two perpendicular axes (for instance, x and y axes) on the top or bottom surface of the semiconductor device is achieved and leads to the proper interfaces between the external terminals of the semiconductor device under test and the contact pins of the test socket, and thereby improves the quality of connection therebetween.
摘要翻译： 本发明涉及一种用于测试半导体器件的插入块。 插入块包括一个或多个推动器，其安装在具有装载空间以容纳被测半导体器件的块体中，包括第一推杆，以对被测半导体器件的相邻侧之一施加力;第二推杆 向另一方施加力量。 因此，实现半导体器件的顶部或底部表面上沿着两个垂直轴（例如x和y轴）测试的半导体器件相对于测试插座的接触针的牢固定心，并且导致适当的接口 在被测半导体器件的外部端子和测试插座的接触引脚之间，从而提高其间的连接质量。
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公开(公告)号：US20060071656A1
公开(公告)日：2006-04-06
申请号：US11243458
申请日：2005-10-03
IPC分类号： G01R31/28
CPC分类号： G01R1/0408 , G01R1/0466 , G01R1/0483
摘要： The present invention relates to an insert block for testing semiconductor devices. The insert block comprises one or more pushers, installed in a block body having a loading space to accommodate a semiconductor device under test, including a first push rod to apply force to one of adjacent sides of the semiconductor device under test and a second push rod to apply force to the other thereof. Accordingly, firm centering of semiconductor devices under test relative to the contact pins of the test socket along the two perpendicular axes (for instance, x and y axes) on the top or bottom surface of the semiconductor device is achieved and leads to the proper interfaces between the external terminals of the semiconductor device under test and the contact pins of the test socket, and thereby improves the quality of connection therebetween.
摘要翻译： 本发明涉及一种用于测试半导体器件的插入块。 插入块包括一个或多个推动器，其安装在具有装载空间以容纳被测半导体器件的块体中，包括第一推杆，以对被测半导体器件的相邻侧之一施加力;第二推杆 向另一方施加力量。 因此，实现半导体器件的顶部或底部表面上沿着两个垂直轴（例如x和y轴）测试的半导体器件相对于测试插座的接触针的牢固定心，并且导致适当的接口 在被测半导体器件的外部端子和测试插座的接触引脚之间，从而提高其间的连接质量。
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公开(公告)号：US07245138B2
公开(公告)日：2007-07-17
申请号：US11325145
申请日：2006-01-03
IPC分类号： G01R31/02
CPC分类号： G01R1/0466 , G01R1/0483 , G01R1/06722
摘要： A POGO pin that can measure low frequency products as well as RF products and also have a long life span, and a test socket including the POGO pin are provided. The POGO pin includes a metal plunger formed of a conductive metal so as to electrically contact the semiconductor package, and a rubber contact pin connected with the metal plunger and formed of a conductive rubber so as to electrically contact the test board.
摘要翻译： 一个POGO引脚，可以测量低频产品以及RF产品，并且具有较长的使用寿命，并提供包含POGO引脚的测试插座。 POGO针包括由导电金属形成的金属柱塞，以与半导体封装件电接触;以及橡胶触针，与金属柱塞连接并由导电橡胶形成，以便电接触测试板。
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公开(公告)号：US20060145719A1
公开(公告)日：2006-07-06
申请号：US11325145
申请日：2006-01-03
IPC分类号： G01R31/02
CPC分类号： G01R1/0466 , G01R1/0483 , G01R1/06722
摘要： A POGO pin that can measure low frequency products as well as RF products and also have a long life span, and a test socket including the POGO pin are provided. The POGO pin includes a metal plunger formed of a conductive metal so as to electrically contact the semiconductor package, and a rubber contact pin connected with the metal plunger and formed of a conductive rubber so as to electrically contact the test board.
摘要翻译： 一个POGO引脚，可以测量低频产品以及RF产品，并且具有较长的使用寿命，并提供包含POGO引脚的测试插座。 POGO针包括由导电金属形成的金属柱塞，以与半导体封装件电接触;以及橡胶触针，与金属柱塞连接并由导电橡胶形成，以便电接触测试板。
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公开(公告)号：US20060119375A1
公开(公告)日：2006-06-08
申请号：US11274703
申请日：2005-11-14
申请人： Jun-Young Ko , Seok-Young Yoon , Hyeck-Jin Jeong
发明人： Jun-Young Ko , Seok-Young Yoon , Hyeck-Jin Jeong
IPC分类号： G01R31/02
CPC分类号： G01R31/2898 , G01R1/0466 , G01R1/0483 , G01R1/06722 , G01R3/00
摘要： An apparatus includes a test board for testing electrical characteristics of the semiconductor chip; socket pins vertically disposed on the test board to electrically connect the test board, and external terminals of the semiconductor chip; socket springs interposed between the socket pins and the test board and making the socket pins vertically elastic; a plurality of laser beam transmitters vertically penetrating the socket pins, the socket springs, and the test board; and a laser beam source supplying laser beams to the laser beam transmitters.
摘要翻译： 一种装置包括用于测试半导体芯片的电气特性的测试板; 垂直设置在测试板上的插座引脚用于电连接测试板和半导体芯片的外部端子; 插座弹簧介于插座销和测试板之间，并使插座销垂直弹性; 垂直穿过插座销，插座弹簧和测试板的多个激光束发射器; 以及向激光束发射器提供激光束的激光束源。
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公开(公告)号：US07420382B2
公开(公告)日：2008-09-02
申请号：US11274703
申请日：2005-11-14
申请人： Jun-Young Ko , Seok-Young Yoon , Hyeck-Jin Jeong
发明人： Jun-Young Ko , Seok-Young Yoon , Hyeck-Jin Jeong
IPC分类号： G01R31/02
CPC分类号： G01R31/2898 , G01R1/0466 , G01R1/0483 , G01R1/06722 , G01R3/00
摘要： An apparatus includes a test board for testing electrical characteristics of the semiconductor chip; socket pins vertically disposed on the test board to electrically connect the test board, and external terminals of the semiconductor chip; socket springs interposed between the socket pins and the test board and making the socket pins vertically elastic; a plurality of laser beam transmitters vertically penetrating the socket pins, the socket springs, and the test board; and a laser beam source supplying laser beams to the laser beam transmitters.
摘要翻译： 一种装置包括用于测试半导体芯片的电气特性的测试板; 垂直设置在测试板上的插座引脚用于电连接测试板和半导体芯片的外部端子; 插座弹簧介于插座销和测试板之间，并使插座销垂直弹性; 垂直穿过插座销，插座弹簧和测试板的多个激光束发射器; 以及向激光束发射器提供激光束的激光束源。
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公开(公告)号：US20070182432A1
公开(公告)日：2007-08-09
申请号：US11488597
申请日：2006-07-19
申请人： Hyeck-Jin Jeong , Seon-Ju Oh , Seok-Young Yoon
发明人： Hyeck-Jin Jeong , Seon-Ju Oh , Seok-Young Yoon
IPC分类号： G01R31/02
CPC分类号： G01R1/0466 , H01L2224/16225
摘要： An insert for loading a semiconductor package having external connection terminals may have a support plate. The support plate may have an upper surface with first contact pads and a lower surface with second contact pads. The first contact pads may be electrically connected to the external connection terminals of the semiconductor package and the second contact pads may be electrically connected to test connection terminals of a test socket.
摘要翻译： 用于加载具有外部连接端子的半导体封装的插入件可以具有支撑板。 支撑板可以具有带有第一接触垫的上表面和具有第二接触垫的下表面。 第一接触焊盘可以电连接到半导体封装的外部连接端子，并且第二接触焊盘可以电连接到测试插座的测试连接端子。
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公开(公告)号：US20070141877A1
公开(公告)日：2007-06-21
申请号：US11638584
申请日：2006-12-14
申请人： Se-Un Lee , Seok-Young Yoon , Jin-Woog Kim , Hyeck-Jin Jeong
发明人： Se-Un Lee , Seok-Young Yoon , Jin-Woog Kim , Hyeck-Jin Jeong
IPC分类号： H01R13/44
CPC分类号： H01R13/03 , G01R1/0466 , G01R1/06722 , G01R1/06738 , G01R1/06755 , H01R12/714 , H01R13/2421
摘要： A socket pin for a test apparatus. The socket pin may have self-cleaning function and may include a main body of a socket, a bottom contact tip at a lower portion of the main body, a first spring in the main body and connected to the bottom contact tip, a top contact tip at an upper portion of the main body, and a conductive contact ball at end of the top contact tip.
摘要翻译： 用于测试设备的插座针。 插座销可以具有自清洁功能，并且可以包括插座的主体，主体的下部的底部接触尖端，主体中的第一弹簧并连接到底部接触尖端，顶部触点 尖端在主体的上部，以及在顶部接触尖端的端部处的导电接触球。
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9.发明授权Insert having independently movable latch mechanism for semiconductor package 有权插入件具有用于半导体封装的可独立移动的闩锁机构公开(公告)号：US07235991B2
公开(公告)日：2007-06-26
申请号：US11391381
申请日：2006-03-29
申请人： Jin-Woog Kim , Seok-Ho Jin , Seok-Young Yoon , Se-Un Lee , Hyeck-Jin Jeong
发明人： Jin-Woog Kim , Seok-Ho Jin , Seok-Young Yoon , Se-Un Lee , Hyeck-Jin Jeong
CPC分类号： G01R31/2893
摘要： In an example embodiment, an insert having an independently movable latch mechanism for loading a semiconductor package may include an insert body having a pocket, latch units installed at opposite sides of the pocket, and a press plate elastically installed above the insert body. The latch units prevent a loaded semiconductor package from escaping out of the pocket. The press plate may operate the latch unit by movement relative to an upper surface of the insert body. Each latch may be movably connected to the insert body such that a first end of the latch is rotatable around a fixed shaft pin. A second end of the latch may be movable into and out of the pocket. The latch may have a front surface slanted downwards towards the center of the pocket and have a guide hole near the back surface, opposite the front surface. A button connected to the latch by a moving shaft pin may be elastically coupled between the latch and the press plate, the button projecting upwards from the insert body and converting the movement of the press plate into rotational movement of the latch by causing the moving shaft pin to move along the guide hole. The movement of the shaft pin rotates the latch about the fixed shaft pin. The guide hole includes a guide hole correction space that permits movement of the moving shaft pin into the guide hole correction space such that the latch rotates about the fixed shaft pin independent of the movement of the press plate. An elastic body may be located between a back of the latch having the guide hole and the insert body near to the side of the latch, such that the elastic body applies an elastic force to a latch so as to cause the latch to protrude into the pocket.
摘要翻译： 在一个示例性实施例中，具有用于加载半导体封装的独立可移动的闩锁机构的插入件可以包括具有口袋的插入本体，安装在口袋的相对侧的闩锁单元以及弹性地安装在插入体上方的压板。 闩锁单元防止加载的半导体封装从口袋中逸出。 压板可以通过相对于插入体的上表面的运动来操作闩锁单元。 每个闩锁可以可移动地连接到插入体，使得闩锁的第一端可围绕固定的轴销旋转。 闩锁的第二端可以移动进入和离开口袋。 闩锁可以具有朝向凹部的中心向下倾斜的前表面，并且在后表面附近具有与前表面相对的引导孔。 通过移动的轴销连接到闩锁的按钮可以弹性地联接在闩锁和压板之间，按钮从插入体向上突出并且通过使移动轴线将压板的移动转换成闩锁的旋转运动 销沿导向孔移动。 轴销的运动使闩锁围绕固定轴销旋转。 引导孔包括引导孔校正空间，该引导孔修正空间允许移动轴销移动到引导孔校正空间中，使得闩锁围绕固定轴销旋转，而与压板的运动无关。 弹性体可以位于具有引导孔的闩锁的后部和插入物体靠近闩锁侧面之间，使得弹性体向闩锁施加弹性力，以使闩锁突出到 口袋。
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公开(公告)号：US20070075702A1
公开(公告)日：2007-04-05
申请号：US11391381
申请日：2006-03-29
申请人： Jin-Woog Kim , Seok-Ho Jin , Seok-Young Yoon , Se-Un Lee , Hyeck-Jin Jeong
发明人： Jin-Woog Kim , Seok-Ho Jin , Seok-Young Yoon , Se-Un Lee , Hyeck-Jin Jeong
IPC分类号： G01R31/28
CPC分类号： G01R31/2893
摘要： In an example embodiment, an insert having an independently movable latch mechanism for loading a semiconductor package may include an insert body having a pocket, latch units installed at opposite sides of the pocket, and a press plate elastically installed above the insert body. The latch units prevent a loaded semiconductor package from escaping out of the pocket. The press plate may operate the latch unit by movement relative to an upper surface of the insert body. Each latch may be movably connected to the insert body such that a first end of the latch is rotatable around a fixed shaft pin. A second end of the latch may be movable into and out of the pocket. The latch may have a front surface slanted downwards towards the center of the pocket and have a guide hole near the back surface, opposite the front surface. A button connected to the latch by a moving shaft pin may be elastically coupled between the latch and the press plate, the button projecting upwards from the insert body and converting the movement of the press plate into rotational movement of the latch by causing the moving shaft pin to move along the guide hole. The movement of the shaft pin rotates the latch about the fixed shaft pin. The guide hole includes a guide hole correction space that permits movement of the moving shaft pin into the guide hole correction space such that the latch rotates about the fixed shaft pin independent of the movement of the press plate. An elastic body may be located between a back of the latch having the guide hole and the insert body near to the side of the latch, such that the elastic body applies an elastic force to a latch so as to cause the latch to protrude into the pocket.
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