公开(公告)号：US5191294A

公开(公告)日：1993-03-02

申请号：US917909

申请日：1992-07-21

Applicant: Martin I. Grace ,  Donald A. Bradley ,  James N. Liu

Inventor： Martin I. Grace ,  Donald A. Bradley ,  James N. Liu

IPC: G01R29/26

CPC classification number: G01R29/26

Abstract: Apparatus for measuring the noise parameters of a device under test (DUT), with full compensation for impedance mismatches between the DUT and the test apparatus. The apparatus includes an S-parameter measuring device, such as vector network analyzer (VNA), combined with a noise module. The noise module includes, among other things, a pair of test ports for the DUT, a noise source which can be turned on or off by an external controller, a receiver, and a switch for coupling the output of the DUT to selectably either the receiver or port 2 of the VNA.

Abstract translation: 用于测量待测器件（DUT）的噪声参数的设备，完全补偿DUT和测试设备之间的阻抗失配。 该装置包括与噪声模块组合的诸如矢量网络分析仪（VNA）的S参数测量装置。 除了别的以外，噪声模块包括用于DUT的一对测试端口，可以由外部控制器，接收器和用于将DUT的输出耦合到DUT的输出的开关的开关的噪声源， 接收机或VNA的端口2。