Advanced cable metrology system
    1.
    发明申请
    Advanced cable metrology system 失效
    先进的电缆测量系统

    公开(公告)号:US20060116852A1

    公开(公告)日:2006-06-01

    申请号:US11000631

    申请日:2004-12-01

    CPC classification number: B60R16/0207 G01B15/00

    Abstract: The present invention is a method for determining the center to center spacing of conductors in an insulated, multi-conductor, flat cable. The method comprising applying an X-ray field to the cable, detecting the X-ray field intensity that passes through the cable, obtaining a digitized output waveform of the X-ray field intensity as a function of cable position, and determining a trough location of the waveform by averaging calculated position values for the center of the conductor at several longitudinal positions along a cross section of the conductor.

    Abstract translation: 本发明是用于确定绝缘多导体扁平电缆中的导体的中心到中心间隔的方法。 该方法包括对电缆施加X射线场,检测通过电缆的X射线场强度,获得作为电缆位置的函数的X射线场强度的数字化输出波形,以及确定槽位置 通过在沿着导体的横截面的几个纵向位置处对导体的中心的计算的位置值求平均来计算波形。

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