ENDOSCOPE INSPECTION SYSTEM
    3.
    发明申请
    ENDOSCOPE INSPECTION SYSTEM 审中-公开
    内窥镜检查系统

    公开(公告)号:US20100076262A1

    公开(公告)日:2010-03-25

    申请号:US12562948

    申请日:2009-09-18

    IPC分类号: A61B1/04

    CPC分类号: A61B5/0205 A61B1/05

    摘要: An endoscope inspection system. An image-capturing device is disposed on an endoscope probe and is electrically connected to a signal conditioning unit. A differential electrode set includes an annular detecting electrode and a reference electrode. The annular detecting electrode surrounds the endoscope probe. The annular detecting electrode, reference electrode, and display are electrically connected to the signal conditioning unit.

    摘要翻译: 内窥镜检查系统。 图像捕获装置设置在内窥镜探针上并与电信号调节装置电连接。 差动电极组包括环形检测电极和参考电极。 环形检测电极围绕内窥镜探针。 环状检测电极,参考电极和显示器电连接到信号调节单元。