Systems and Methods for High-Throughput Turbidity Measurements
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    发明申请
    Systems and Methods for High-Throughput Turbidity Measurements 审中-公开
    高通量浊度测量系统和方法

    公开(公告)号:US20100110220A1

    公开(公告)日:2010-05-06

    申请号:US12615093

    申请日:2009-11-09

    IPC分类号: G06K9/00 G01N21/59 H04N5/222

    摘要: A turbidity measurement system includes a sample assembly that contains a plurality of samples, a light source that illuminates the sample assembly, and a light detection system that includes a two-dimensional light-sensitive array. The light-sensitive array is simultaneously exposed to light transmitted through each of the samples in the sample assembly. The exposure is analyzed to determine a mean transmitted light intensity for each sample and to calculate a turbidity value for each sample based on its mean transmitted light intensity. Multiple exposures may be taken during a measurement period so as to obtain time-resolved turbidity measurements of the samples. The temperature of the samples may be varied during the measurement period so as to measure turbidity as a function of temperature.

    摘要翻译: 浊度测量系统包括包含多个样品的样品组件,照亮样品组件的光源和包括二维光敏阵列的光检测系统。 光敏阵列同时暴露于透过样品组件中每个样品的光。 分析曝光以确定每个样品的平均透射光强度,并且基于其平均透射光强度来计算每个样品的浊度值。 在测量期间可以进行多次曝光,以获得样品的时间分辨浊度测量值。 样品的温度可以在测量期间变化,以便测量作为温度的函数的浊度。