公开(公告)号：US5943125A

公开(公告)日：1999-08-24

申请号：US807397

申请日：1997-02-26

申请人： Steven Joseph King ,  Jonathan Edmund Ludlow ,  Jon Chouinard ,  George Schurr

发明人： Steven Joseph King ,  Jonathan Edmund Ludlow ,  Jon Chouinard ,  George Schurr

IPC分类号： G01B11/03 ,  G01N21/88 ,  G01N21/956 ,  H05K13/08 ,  G01N21/00 ,  G01B11/14 ,  H04N7/18 ,  H04N9/47

CPC分类号： G01N21/95684 ,  G01N21/8806 ,  H05K13/08

摘要： An inspection system and method uses a ring illumination apparatus to illuminate one or more reflective elements, such as solder balls on an electronic component or other protruding surfaces or objects. The ring illumination apparatus includes a substantially ring-shaped light source that provides a substantially even illumination across the one or more reflective elements. An illumination detection device detects light beams reflecting off of the illuminated reflective elements for forming a reflected image. A method of processing the reflected image includes locating one or more edges of each reflected image element representing an illuminated reflective element. The edges of the reflected image elements are located by determining the maximum intensity gradient in the pixels forming the reflected image element. The inspection system and method thereby determines various characteristics such as the absence/presence, location, pitch, size and shape of each reflective element.

摘要翻译： 检查系统和方法使用环形照明装置来照射一个或多个反射元件，例如电子部件上的焊球或其它突出的表面或物体。 环形照明装置包括基本上环形的光源，其在一个或多个反射元件上提供基本均匀的照明。 照明检测装置检测用于形成反射图像的照射反射元件反射的光束。 处理反射图像的方法包括定位表示照明反射元件的每个反射图像元素的一个或多个边缘。 通过确定形成反射图像元素的像素中的最大强度梯度来定位反射图像元素的边缘。 检查系统和方法由此确定各种特征，例如每个反射元件的不存在，存在，位置，间距，尺寸和形状。