公开(公告)号：US20070260950A1

公开(公告)日：2007-11-08

申请号：US11355681

申请日：2006-02-16

Applicant: Gary Morrison ,  Jose Lyon ,  William Moyer ,  Anthony Reipold

Inventor： Gary Morrison ,  Jose Lyon ,  William Moyer ,  Anthony Reipold

IPC: G01R31/28

CPC classification number: G01R31/318544 ,  G01R31/318536 ,  G01R31/318552 ,  G06F11/2236

Abstract: A method for testing at least one logic block of a processor includes, during execution of a user application by the processor, the processor generating a stop and test indicator. In response to the generation of the stop and test indicator, stopping the execution of the user application and, if necessary, saving a state of the at least one logic block of the processor. The method further includes applying a test stimulus for testing the at least one logic block of the processor. The test stimulus may be shifted into scan chains so as to perform scan testing of the processor during normal operation, such as during execution of a user application.

Abstract translation: 用于测试处理器的至少一个逻辑块的方法包括在处理器执行用户应用期间，处理器产生停止和测试指示符。 响应于产生停止和测试指示符，停止执行用户应用程序，并且如果需要，保存处理器的至少一个逻辑块的状态。 该方法还包括应用用于测试处理器的至少一个逻辑块的测试激励。 测试刺激可以被转移到扫描链中，以便在正常操作期间，例如在用户应用的执行期间执行处理器的扫描测试。

公开(公告)号：US20060007763A1

公开(公告)日：2006-01-12

申请号：US10889159

申请日：2004-07-12

Applicant: Paul Gelencser ,  Jose Lyon

Inventor： Paul Gelencser ,  Jose Lyon

IPC: G11C29/00

CPC classification number: G11C29/4401 ,  G11C29/44 ,  G11C29/808

Abstract: An automated process for designing a memory having row/column replacement is provided. In one embodiment, a potential solution array (50) is used in conjunction with the row/column locations of memory cell failures to determine values stored in the actual solution storage circuitry (92). A selected one of these vectors stored in the actual solution storage circuitry (92) is then used to determine rows and columns in memory array (20) to be replaced with redundant rows (22, 24) and redundant columns (26).

Abstract translation: 提供了一种用于设计具有行/列替换的存储器的自动化过程。 在一个实施例中，潜在解阵列（50）与存储器单元故障的行/列位置结合使用以确定存储在实际解存储电路（92）中的值。 存储在实际解决方案存储电路（92）中的这些向量中选择的一个矢量然后被用于确定要用冗余行（22,24）和冗余列（26）替换的存储器阵列（20）中的行和列。