Current mirror methodology quantifying time dependent thermal instability accurately in SOI BJT circuitry
    1.
    发明授权
    Current mirror methodology quantifying time dependent thermal instability accurately in SOI BJT circuitry 有权
    电流镜法在SOI BJT电路中精确地量化时间依赖性热不稳定性

    公开(公告)号:US07422366B1

    公开(公告)日:2008-09-09

    申请号:US10939006

    申请日:2004-09-10

    IPC分类号: G01K7/01

    CPC分类号: G01K7/01 G01R31/2621

    摘要: A current mirror method is provided that can be utilized to evaluate thermal issues is silicon-on-insulator (SOI) bipolar junction transistors (BJTs). The method significantly improves safe operating area (SOA) measurement sensitivity. Unlike conventional methods, the current mirror method can provide quantitative analysis of the BJTs thermal instability over a wide power range, even in the apparent SOA of the device. This method can also predict and evaluate SOA with respect to emitter ballast resistance and current crowding.

    摘要翻译: 提供了可用于评估热问题的电流镜方法,即绝缘体上硅(SOI)双极结型晶体管(BJT)。 该方法显着提高了安全操作面积(SOA)测量灵敏度。 与传统方法不同,即使在器件的明显SOA中,电流镜法也可以在宽功率范围内提供BJT热不稳定性的定量分析。 该方法还可以针对发射器镇流电阻和电流拥挤来预测和评估SOA。