公开(公告)号：US4079237A

公开(公告)日：1978-03-14

申请号：US631412

申请日：1975-11-12

申请人： Julius Schlesinger

发明人： Julius Schlesinger

IPC分类号： G01Q40/00 ,  G01B15/02 ,  G06F15/52 ,  G01N23/203

CPC分类号： G01B15/02

摘要： An improved beta backscatter instrument for the non-destructive measurement of the thickness of thin coatings on a substrate. Included therein is the utilization of a bank of memory stored data representative of isotope, substrate, coating material and thickness range characteristics in association with a control card having predetermined indicia thereon selectively representative of a particular isotope, substrate material, coating material and thickness range for conditioning electronic circuit means by memory stored data selected in accord with the predetermined indicia on a control card for converting backscattered beta particle counts into indicia of coating thickness.

摘要翻译： 一种改进的β反向散射仪器，用于对基底上的薄涂层的厚度进行非破坏性测量。 其中包括使用一组存储器代表同位素，衬底，涂层材料和厚度范围特性的存储数据与具有其上的预定标记的控制卡相关联，选择性地代表特定同位素，衬底材料，涂层材料和厚度范围 调节电子电路装置是通过在控制卡上存储根据预定标记选择的存储数据的装置，用于将反散射的β粒子计数转换成涂层厚度的标记。

公开(公告)号：US4155009A

公开(公告)日：1979-05-15

申请号：US785530

申请日：1977-04-07

申请人： Sidney Lieber ,  Julius Schlesinger ,  Derek Lieber ,  Alfred Baker

发明人： Sidney Lieber ,  Julius Schlesinger ,  Derek Lieber ,  Alfred Baker

IPC分类号： G01B15/02 ,  G01N23/203 ,  G01N23/00 ,  G01D18/00

CPC分类号： G01B15/02 ,  G01N23/203

摘要： An improved backscatter instrument for the nondestructive measurement of coatings on a substrate. A memory having selectable memory areas, each area having stored intelligence available which is determinative of the shape of a functional plot of coating thickness versus backscatter counts per minute unique for each particular combination of emitting isotope, substrate material, coating material and physical characteristics of the measuring instrument. A memory selector switch connects a selected area of memory to a microprocessor operating under program control whereby the microprocessor reads the intelligence stored at the selected area and converts the backscattered count of the coating being measured into indicia of coating thickness.

摘要翻译： 一种改进的反向散射仪器，用于对基底上的涂层进行非破坏性测量。 具有可选择存储区域的存储器，每个区域具有可用的存储的智能，其确定涂层厚度与每分钟的每个特定组合的特定组合的涂层厚度与每分钟后向散射计数的功能图的形状的形状，所述特定组合对于发射同位素，衬底材料，涂层材料和物理特性 测量仪器。 存储器选择器开关将存储器的选定区域连接到在程序控制下操作的微处理器，由此微处理器读取存储在所选区域的智能，并将被测量的涂层的背散射计数转换为涂层厚度的标记。