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公开(公告)号:US07659185B2
公开(公告)日:2010-02-09
申请号:US10570285
申请日:2004-09-02
申请人: Jin Jang , Jong-Hyun Choi , Seung-Soo Kim , Jae-Hwan Oh , Jun-Hyuk Chon
发明人: Jin Jang , Jong-Hyun Choi , Seung-Soo Kim , Jae-Hwan Oh , Jun-Hyuk Chon
IPC分类号: H01L21/20
CPC分类号: H01L21/02532 , H01L21/02425 , H01L21/02488 , H01L21/02672 , H01L27/1277 , H01L29/78603
摘要: Disclosed are a method for forming a silicon thin-film on a substrate, and more particularly a method for forming a polycrystalline silicon thin-film of good quality on a flexible metal substrate. A metal substrate (110) is prepared and a surface of the metal substrate (110) is flattened. An insulation film (120) is formed on the metal substrate (110). An amorphous silicon layer (130) is formed on the insulation film (120). A metal layer (140) is formed on the amorphous silicon layer (130). A sample on the metal substrate (110) is heated and crystallized.
摘要翻译: 公开了一种在基板上形成硅薄膜的方法,更具体地说,涉及一种在柔性金属基板上形成质量好的多晶硅薄膜的方法。 准备金属基板(110),使金属基板(110)的表面变平。 在金属基板(110)上形成绝缘膜(120)。 在绝缘膜(120)上形成非晶硅层(130)。 金属层(140)形成在非晶硅层(130)上。 将金属基板(110)上的样品加热并结晶。
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公开(公告)号:US20060286780A1
公开(公告)日:2006-12-21
申请号:US10570285
申请日:2004-09-02
申请人: Jin Jang , Jong-Hyun Choi , Seung-Soo Kim , Jae-Hwan Oh , Jun-Hyuk Chon
发明人: Jin Jang , Jong-Hyun Choi , Seung-Soo Kim , Jae-Hwan Oh , Jun-Hyuk Chon
IPC分类号: H01L21/20
CPC分类号: H01L21/02532 , H01L21/02425 , H01L21/02488 , H01L21/02672 , H01L27/1277 , H01L29/78603
摘要: Disclosed are a method for forming a silicon thin-film on a substrate, and more particularly a method for forming a polycrystalline silicon thin-film of good quality on a flexible metal substrate. A metal substrate (110) is prepared and a surface of the metal substrate (110) is flattened. An insulation film (120) formed on the metal substrate (110). An amorphous silicon layer (130) is formed on the insulation film (120). A metal layer (140) is formed on the amorphous silicon layer (130). A sample on the metal substrate (110) is heated and crystallized.
摘要翻译: 公开了一种在基板上形成硅薄膜的方法,更具体地说,涉及一种在柔性金属基板上形成质量好的多晶硅薄膜的方法。 准备金属基板(110),使金属基板(110)的表面变平。 形成在金属基板(110)上的绝缘膜(120)。 在绝缘膜(120)上形成非晶硅层(130)。 金属层(140)形成在非晶硅层(130)上。 将金属基板(110)上的样品加热并结晶。
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