公开(公告)号：US20160125109A1

公开(公告)日：2016-05-05

申请号：US14531598

申请日：2014-11-03

Applicant: Keysight Technologies, Inc. ,  Keysight Technologies, Inc. ,  Keysight Technologies, Inc. ,  Keysight Technologies, Inc. ,  Keysight Technologies, Inc. ,  Keysight Technologies, Inc. ,  Keysight Technologies, Inc.

Inventor： Krishna Kumar Banka ,  Prantik Sarkar ,  Harald Devos ,  Peter Niday ,  John Robert Kenneth Lefebvre, II ,  Arbind Kumar ,  Atul Dubey

IPC: G06F17/50

CPC classification number: G06F17/5022 ,  G06F17/5036 ,  G06F17/505

Abstract: A method for operating a data processing system to simulate a circuit that includes a plurality of circuit devices connected by interconnects. A layout description of the circuit is provided in which the devices are connected by interconnects. Each interconnect is associated with a line definition that includes a physical description of an interconnect between two of the circuit devices and a simulation model to be used in simulating the interconnect during simulations of the circuit. The line definitions are user selectable from a list of available line definitions. A circuit netlist is generated by reading physical interconnects from the layout. At least one of the interconnects is replaced by a plurality of transmission line devices, each device being associated with the simulation model included in the line definition. The circuit is then simulated using the netlist.

Abstract translation: 一种用于操作数据处理系统以模拟包括通过互连连接的多个电路装置的电路的方法。 提供了电路的布局描述，其中设备通过互连连接。 每个互连与线路定义相关联，线路定义包括两个电路设备之间的互连的物理描述以及用于在电路仿真期间模拟互连的仿真模型。 线路定义可以从可用线路定义的列表中进行用户选择。 通过从布局读取物理互连产生电路网表。 至少一个互连由多个传输线设备替代，每个设备与线路定义中包括的仿真模型相关联。 然后使用网表模拟电路。

公开(公告)号：US11101905B1

公开(公告)日：2021-08-24

申请号：US16923974

申请日：2020-07-08

Applicant: Keysight Technologies, Inc. ,  Keysight Technologies, Inc.

Inventor： Rulon Van Dyke ,  Tong Zhou Wu

IPC: G06F30/39 ,  G06F30/31 ,  H04B17/391 ,  H04B17/10

Abstract: A method for operating a data processing system to generate an estimate of radiative contamination at nodes in an RF circuit characterized by a plurality of circuit elements connected by metal traces on a circuit board are disclosed. The data processing system to receive information specifying a coupled radiation matrix based on the metal traces and a simulation of an RF circuit with the components connected by non-radiating nodes. The data processing system generates a coupled power list for at least one node of the model, each entry in the coupled power list includes a coupled power value indicating a power level received by EM radiation from another of the nodes.

公开(公告)号：US20160253620A1

公开(公告)日：2016-09-01

申请号：US14634673

申请日：2015-02-27

Applicant: Keysight Technologies, Inc. ,  Keysight Technologies, Inc. ,  Keysight Technologis, Inc.

Inventor： Graham S. Pollock ,  Stanley T. Jefferson ,  Daniel L. Pleasant

IPC: G06Q10/08 ,  G06F17/30

CPC classification number: G06Q10/087

Abstract: A method for operating a data processing system to discover the attributes of instruments in a set of instruments connected thereto is disclosed. The method causes the data processing system to determine all instruments in the set of instruments connected thereto by sending a first query on each communication link connected to the data processing system. The data processing system receives a response that identifies one of the instruments and a model identification code for that instrument. The data processing system retrieves model configuration information from an instrument catalog database attached to the data processing system based on the manufacturer's catalog information. The model configuration information includes an option that is available on the one of the instruments having the manufacturer's catalog information and a query that will cause that instrument to provide information on whether that option is installed on the one of the instruments.

Abstract translation: 公开了一种用于操作数据处理系统以发现与其连接的一组仪器中的仪器属性的方法。 该方法使得数据处理系统通过在连接到数据处理系统的每个通信链路上发送第一查询来确定与其相连的一组仪器中的所有仪器。 数据处理系统接收到识别仪器之一的响应和该仪器的型号识别码。 数据处理系统根据制造商的目录信息从连接到数据处理系统的仪器目录数据库中检索模型配置信息。 模型配置信息包括在具有制造商的目录信息的一个仪器上可用的选项，以及将导致该仪器提供关于是否在该仪器上安装该选项的信息的查询的选项。

公开(公告)号：US20250138079A1

公开(公告)日：2025-05-01

申请号：US18384993

申请日：2023-10-30

Applicant: Keysight Technologies, Inc.

Inventor： Maxim Pletner ,  Ailee Grumbine ,  Karamveer Singh

IPC: G01R31/28 ,  H04B17/391

Abstract: A system for testing a cellular device under test (DUT) includes a display device for displaying a mirror image of a screen of the cellular DUT, and a network emulator configured to emulate a cellular network while in communication with the cellular DUT. The system further includes a sequencer engine module, including a graphical user automated testing interface displayed on the display device together with the mirror image of the screen of the cellular DUT, configured to control the network emulator and the cellular DUT, to automatically run a sequence of test commands on the cellular DUT, and to automatically run user emulation scripts. The system further includes a user emulation module configured to emulate a graphical user interface of the DUT by generating the user module scripts according to the sequence of test commands. The system further includes a data analytics module configured to generate display data of measurement results of the DUT on the display device.

公开(公告)号：US20250138074A1

公开(公告)日：2025-05-01

申请号：US18813123

申请日：2024-08-23

Applicant: Keysight Technologies, Inc.

Inventor： David Leyba

IPC: G01R29/26 ,  G01R13/02

Abstract: A test system implemented method is for measuring the noise margin of a repeating signal under test (SUT). The method includes determining a digitizer noise of a digitizer channel of the test system, and applying the repeating SUT to the digitizer channel of the test system. An oversampled equivalent-time waveform representation of the repeating SUT is acquired, and then a filtered waveform representation is obtained. A noise margin om of the repeating SUT is determine in accordance with the equation σm=(σc2+σi2−σd2)1/2, where σc is a standard deviation of a maximum amount of gaussian noise that can added to the filtered waveform representation without its symbol error rate (SER) exceeding a target value, σi is a standard deviation of the digitizer noise, and σd is a standard deviation of the noise components removed to obtain the filter waveform representation.

公开(公告)号：US12283986B2

公开(公告)日：2025-04-22

申请号：US18127184

申请日：2023-03-28

Applicant: Keysight Technologies, Inc.

Inventor： Marcel Zeiler ,  Bernd Nebendahl

IPC: G02B6/293 ,  H04B10/079 ,  H04B10/61

Abstract: An apparatus for determining a wavelength and a power of an input signal is described. The apparatus comprises a memory which stores instructions, which when executed by the processor, cause the processor to: recover a first phase for a first Mach-Zehnder Interferometer MZI; recover a second phase for a second MZI; subtract the first phase from the second phase to provide a phase difference; determine an unwrapped phase difference as a function of wavelength; determine a coarse wavelength; and determine a first wavelength for the first FSR and a second wavelength from the second FSR; and average the first and second wavelengths to determine the wavelength of the input signal.

公开(公告)号：US20250119270A1

公开(公告)日：2025-04-10

申请号：US18378113

申请日：2023-10-09

Applicant: Keysight Technologies, Inc.

Inventor： Noah Steven Gintis ,  Pinaki Chakrabarti

IPC: H04L7/02 ,  H04J3/06

Abstract: A method for correlating and displaying physical layer and application layer timing information includes detecting an edge transition of a physical layer waveform from a physical clock on a DUT and generating a timestamp for the detected edge transition. A physical clock timing error is determined based on the timestamp for the detected edge transition. Timing protocol messages are exchanged between the test system and the DUT. The test system generates timestamps when transmitting or receiving the timing protocol messages and receives timestamp information from the DUT and a protocol time is determined. The physical clock timing error and the protocol time are correlated and relative times of the physical clock timing error and the protocol time are determined. The method further includes displaying, by a graphical user interface on the test system, a graphical representation of the relative times of the physical clock timing error and the protocol time.

公开(公告)号：US12255794B2

公开(公告)日：2025-03-18

申请号：US17695759

申请日：2022-03-15

Applicant: Keysight Technologies, Inc.

Inventor： Jonathan Lee Harrod ,  Shardendu Pandey ,  Jonathan Glenn Stroud ,  Stefan Jan Johansson

IPC: H04L43/062 ,  H04L43/00 ,  H04L43/028

Abstract: A method for selectively processing a packet flow using a flow inspection engine is disclosed. The method includes receiving, by at least one hardware data plane processor component in a network packet broker, a plurality of packets associated with a packet flow, and forwarding, by the at least one hardware data plane processor component to at least one flow inspection engine, a copy of at least a portion of one or more of the initial packets of the packet flow. The method further includes providing, by the at least one hardware data plane processor component to the at least one flow inspection engine, packet flow statistical data resulting from a high throughput processing of the plurality of packets by the at least one hardware data plane processor component and generating, by the at least one flow inspection engine, metadata records using the copy at least a portion of the of the one or more of the initial packets and the packet flow statistical data, wherein the at least one hardware data plane processor component generates the statistical data from the plurality of packets independent of any instruction from the at least one flow inspection engine.

公开(公告)号：US12203739B2

公开(公告)日：2025-01-21

申请号：US17538573

申请日：2021-11-30

Applicant: Keysight Technologies, Inc.

Inventor： Christopher Coleman ,  Ryan Scott

IPC: G01B11/00 ,  G02B27/42

Abstract: A system for determining optical probe location relative to a photonic integrated circuit (PIC) is described. A diffractive optical element (DOE) disposed in the PIC, and has a focal point of absolute maximum reflection at location having coordinates in three-dimensions above the PIC. The system includes an optical waveguide probe, and an optical source adapted to provide light through the optical waveguide probe and incident on the DOE. The DOE reflects and focuses light back to the optical waveguide probe, and a power meter is adapted to receive at least a portion of the light reflected and focused at the focal point above the PIC. Based on the determination of a location of the absolute maximum reflection, consistent and reliable testing of PIC can be achieved.

公开(公告)号：US20250020880A1

公开(公告)日：2025-01-16

申请号：US18899013

申请日：2024-09-27

Applicant: Keysight Technologies, Inc.

Inventor： Christopher Coleman ,  Ryan Scott

IPC: G02B6/42

Abstract: A system for determining optical probe location relative to a photonic integrated circuit (PIC) is described. A diffractive optical element (DOE), which includes a plurality of lens elements, is disposed in the PIC, and has a focal point of absolute maximum reflection at location having coordinates in three-dimensions above the PIC. The system includes an optical waveguide probe, and an optical source adapted to provide light through the optical waveguide probe and incident on the DOE. The DOE reflects and focuses light back to the optical waveguide probe, and a power meter is adapted to receive at least a portion of the light reflected and focused at the focal point above the PIC. Based on the determination of a location of the absolute maximum reflection, consistent and reliable testing of PIC can be achieved.