公开(公告)号：US20060036390A1

公开(公告)日：2006-02-16

申请号：US10919170

申请日：2004-08-16

申请人： Aik Loh ,  Keen Wai ,  Tiam Tan ,  Roy Williams ,  Daniel Whang ,  Chen Low ,  Ellis Yuan

发明人： Aik Loh ,  Keen Wai ,  Tiam Tan ,  Roy Williams ,  Daniel Whang ,  Chen Low ,  Ellis Yuan

IPC分类号： G01R27/28

CPC分类号： G01R31/2834 ,  G01R31/2843 ,  G01R31/2846

摘要： A method for configuring an automated in-circuit test debugger is presented. The novel test debug and optimization configuration technique configures expert knowledge into a knowledge framework for use by an automated test debug and optimization system for automating the formulation of a valid stable in-circuit test for execution on an integrated circuit tester. In a system that includes a rule-based controller for controlling interaction between the test-head controller of an integrated circuit tester and an automated debug system, the invention includes a knowledge framework and a rule-based editor. The knowledge framework stores test knowledge in the representation of rules that represent a debugging strategy. The rule-based editor facilitates the use of rules as knowledge to debug or optimize an in-circuit test that is to be executed on the integrated circuit tester.

公开(公告)号：US20050251715A1

公开(公告)日：2005-11-10

申请号：US10839955

申请日：2004-05-05

申请人： Aik Loh ,  Keen Wai ,  Tiam Tan ,  Roy Williams

发明人： Aik Loh ,  Keen Wai ,  Tiam Tan ,  Roy Williams

IPC分类号： G01R31/28 ,  G01R31/3183 ,  G06F11/00 ,  G06F11/25

CPC分类号： G01R31/31835 ,  G06F11/2257

摘要： A method and apparatus for automatically debugging and optimizing an in-circuit test that is used to test a device under test on an automated tester is presented. The novel test debug and optimization technique extracts expert knowledge contained in a knowledge framework and automates the formulation of a valid stable, and preferably optimized, test for execution on an integrated circuit tester.

摘要翻译： 提出了一种用于自动调试和优化用于在自动测试仪上测试被测设备的在线测试的方法和装置。 新颖的测试调试和优化技术提取知识框架中包含的专家知识，并自动制定有效稳定且优化的集成电路测试仪执行测试。