公开(公告)号：US20060036390A1

公开(公告)日：2006-02-16

申请号：US10919170

申请日：2004-08-16

申请人： Aik Loh ,  Keen Wai ,  Tiam Tan ,  Roy Williams ,  Daniel Whang ,  Chen Low ,  Ellis Yuan

发明人： Aik Loh ,  Keen Wai ,  Tiam Tan ,  Roy Williams ,  Daniel Whang ,  Chen Low ,  Ellis Yuan

IPC分类号： G01R27/28

CPC分类号： G01R31/2834 ,  G01R31/2843 ,  G01R31/2846

摘要： A method for configuring an automated in-circuit test debugger is presented. The novel test debug and optimization configuration technique configures expert knowledge into a knowledge framework for use by an automated test debug and optimization system for automating the formulation of a valid stable in-circuit test for execution on an integrated circuit tester. In a system that includes a rule-based controller for controlling interaction between the test-head controller of an integrated circuit tester and an automated debug system, the invention includes a knowledge framework and a rule-based editor. The knowledge framework stores test knowledge in the representation of rules that represent a debugging strategy. The rule-based editor facilitates the use of rules as knowledge to debug or optimize an in-circuit test that is to be executed on the integrated circuit tester.

公开(公告)号：US20050251715A1

公开(公告)日：2005-11-10

申请号：US10839955

申请日：2004-05-05

申请人： Aik Loh ,  Keen Wai ,  Tiam Tan ,  Roy Williams

发明人： Aik Loh ,  Keen Wai ,  Tiam Tan ,  Roy Williams

IPC分类号： G01R31/28 ,  G01R31/3183 ,  G06F11/00 ,  G06F11/25

CPC分类号： G01R31/31835 ,  G06F11/2257

摘要： A method and apparatus for automatically debugging and optimizing an in-circuit test that is used to test a device under test on an automated tester is presented. The novel test debug and optimization technique extracts expert knowledge contained in a knowledge framework and automates the formulation of a valid stable, and preferably optimized, test for execution on an integrated circuit tester.

摘要翻译： 提出了一种用于自动调试和优化用于在自动测试仪上测试被测设备的在线测试的方法和装置。 新颖的测试调试和优化技术提取知识框架中包含的专家知识，并自动制定有效稳定且优化的集成电路测试仪执行测试。

公开(公告)号：US20070013362A1

公开(公告)日：2007-01-18

申请号：US11183342

申请日：2005-07-18

申请人： Aik Loh ,  Roy Williams ,  Keen Fung Wai ,  Chen Low ,  Yi Jin ,  Rex Shang ,  Tiam Hock Tan ,  Daniel Whang

发明人： Aik Loh ,  Roy Williams ,  Keen Fung Wai ,  Chen Low ,  Yi Jin ,  Rex Shang ,  Tiam Hock Tan ,  Daniel Whang

IPC分类号： G01R31/28

CPC分类号： G01R31/2886 ,  G01R31/2894 ,  G01R31/31705 ,  G01R31/31723

摘要： A method and apparatus for maximizing the usage of a testhead of an in-circuit tester is presented. A testhead execution supervisor interfaces between a testhead controller and a graphical user interface used to enter manual tests. The testhead execution supervisor adds tests to be submitted to the testhead to one or more queues according to a priority scheme. Tests may be submitted to the testhead execution supervisor both as manual tests entered via the graphical user interface and as automatically generated tests generated by an automatic debug module. The automatic debug module may automatically generate tests for execution by the testhead that are executed when the testhead is idle, for example when no higher priority manual tests are scheduled.

公开(公告)号：US20070094198A1

公开(公告)日：2007-04-26

申请号：US11183341

申请日：2005-07-18

申请人： Aik Loh

发明人： Aik Loh

IPC分类号： G06N5/02

CPC分类号： G06N5/04

摘要： A software framework for centralizing the management of test plans, test configurations, test sources, debug information for testing electrical devices in a manufacturing testing environment is presented. A three-tier software architecture is defined that allows one-time effort and segregation of tasks related to integration of hardware devices, development of multiple applications, and testing of multiple applications.

摘要翻译： 介绍了一个用于在制造测试环境中集中管理测试计划，测试配置，测试源，测试电气设备的调试信息的软件框架。 定义了一个三层软件体系结构，它允许与硬件设备的集成，多个应用程序的开发和多个应用程序的测试相关的任务的一次性工作和隔离。

公开(公告)号：US20070022323A1

公开(公告)日：2007-01-25

申请号：US11184612

申请日：2005-07-19

申请人： Aik Loh ,  Rex Shang

发明人： Aik Loh ,  Rex Shang

IPC分类号： G06F11/00

CPC分类号： G06F11/263 ,  G01R31/31705 ,  G01R31/318314

摘要： A software framework for centralizing the management of test plans, test configurations, test sources, debug information for testing electrical devices in a manufacturing testing environment is presented. A three-tier software architecture is defined that allows one-time effort and segregation of tasks related to integration of hardware devices, development of multiple applications, and testing of multiple applications.

摘要翻译： 介绍了一个用于在制造测试环境中集中管理测试计划，测试配置，测试源，测试电气设备的调试信息的软件框架。 定义了一个三层软件体系结构，它允许与硬件设备的集成，多个应用程序的开发和多个应用程序的测试相关的任务的一次性工作和隔离。