Pattern writing method during X-ray mask fabrication
    1.
    发明授权
    Pattern writing method during X-ray mask fabrication 失效
    X射线掩模制造过程中的图案写入方法

    公开(公告)号:US5663018A

    公开(公告)日:1997-09-02

    申请号:US654457

    申请日:1996-05-28

    摘要: A pattern writing method for X-ray mask fabrication including forming a uniform membrane layer on an X-ray absorbing layer and forming an etch mask on the layer of X-ray absorbing material including the steps of providing a layer of material sensitive to radiation. The layer of material has internal stresses which are altered by exposure to the radiation. The material is exposed in associated areas (e.g. a spiral) such that the internal stresses within the layer of material and altered internal stresses in the associated areas are substantially offset to reduce distortion in the X-ray mask.

    摘要翻译: 一种用于X射线掩模制造的图案写入方法,包括在X射线吸收层上形成均匀的膜层并在X射线吸收材料层上形成蚀刻掩模,包括以下步骤:提供对辐射敏感的材料层。 材料层具有通过暴露于辐射而改变的内部应力。 该材料在相关联的区域(例如螺旋形)中暴露,使得材料层内的内部应力和相关区域中的改变的内部应力基本上被抵消以减少X射线掩模中的畸变。

    Method of fabricating X-ray masks with reduced errors
    4.
    发明授权
    Method of fabricating X-ray masks with reduced errors 失效
    制造具有减少误差的X射线掩模的方法

    公开(公告)号:US6007948A

    公开(公告)日:1999-12-28

    申请号:US654456

    申请日:1996-05-28

    申请人: Kevin D. Cummings

    发明人: Kevin D. Cummings

    IPC分类号: G03F1/22 H01L21/027 G03F9/00

    CPC分类号: G03F1/22

    摘要: A method of fabricating an X-ray mask including forming a membrane layer on a wafer and forming a layer of X-ray absorbing material on the membrane layer. A pattern is defined on the absorbing layer with positions that are predistorted in accordance with the following equations, and their extensions if desired:.DELTA.Y=M.sub.y Y+.delta.Y.DELTA.X=M.sub.x X+.delta.Xwhere:M.sub.y and M.sub.x are the X and Y magnification errors;.delta.Y includes the terms .alpha.X.sup.4 +.beta.X.sup.2 +.gamma. where,.alpha. includes the terms a.sub.1 Y.sup.3 +a.sub.2 Y.beta. includes the terms a.sub.3 Y.sup.3 +a.sub.4 Y.gamma. includes the terms a.sub.5 Y.sup.3 +a.sub.6 Y;and with corresponding equations for .delta.X. The pattern is then formed in the absorbing layer to form an X-ray mask.

    摘要翻译: 一种制造X射线掩模的方法,包括在晶片上形成膜层并在膜层上形成X射线吸收材料层。 在吸收层上定义图案,其位置根据以下等式预失真,如果需要,则其扩展:DELTA Y = MyY + delta Y DELTA X = MxX + delta X其中:My和Mx是X和Y放大误差 ; ΔY包括术语αX 4 +βX 2 +γ,其中,α包括术语a1Y3 +a2Yβ包括术语a3Y3 + a4Yγ包括术语a5Y3 + a6Y; 并使用ΔX的相应方程式。然后在吸收层中形成图案以形成X射线掩模。