Individual Examination Execution Device
    1.
    发明申请
    Individual Examination Execution Device 有权
    个人考试执行机构

    公开(公告)号:US20080020366A1

    公开(公告)日:2008-01-24

    申请号:US11665658

    申请日:2005-10-17

    IPC分类号: G09B7/00

    CPC分类号: G09B7/07 G09B7/077

    摘要: In a listening comprehension test using individual examination execution devices, it is possible to avoid a dishonest act such as peeping at another examinee's answers. In an individual examination execution device (101), examination question data and individual information are read from an examination question storage means (102) that stores the examination questions and an individual information storage means (103) that stores the individual information, respectively, and actual questions that are selectively generated according to the individual information read by an actual question generation means (104) are reproduced by a reproduction means (105), thereby preventing dishonest acts of the respective examinees.

    摘要翻译: 在使用个人检查执行装置的听力理解测试中,可以避免不诚实的行为,例如窥视另一个受试者的答案。 在单独检查执行装置(101)中,分别从存储检查问题的检查问题存储装置(102)和存储个人信息的个人信息存储装置(103)读取检查问题数据和个人信息,以及 根据由实际问题产生装置(104)读取的个人信息选择性地生成的实际问题由再现装置(105)再现,从而防止各个受试者的不诚实行为。

    Individual examination execution device
    2.
    发明授权
    Individual examination execution device 有权
    个人检查执行装置

    公开(公告)号:US07780452B2

    公开(公告)日:2010-08-24

    申请号:US11665658

    申请日:2005-10-17

    IPC分类号: G09B11/00

    CPC分类号: G09B7/07 G09B7/077

    摘要: In a listening comprehension test using individual examination execution devices, according to the present invention, it is possible to avoid a dishonest act such as peeping at another examinee's answers. An individual examination execution device (101) reads examination question data and individual information from an examination question storage means (102) storing the examination questions and an individual information storage means (103) storing the individual information, respectively. Further, the individual examination device selectively generates actual questions according to the individual information read by an actual question generation means (104), and reproduces the actual questions by a reproduction means (105), thereby preventing dishonest acts of respective examinees.

    摘要翻译: 在使用个别检查执行装置的听力理解测试中,根据本发明,可以避免不诚实的行为,例如窥视另一个受试者的答案。 单独检查执行装置(101)分别从存储检查问题的检查问题存储装置(102)和存储个人信息的个人信息存储装置(103)读取检查问题数据和个人信息。 此外,个人检查装置根据由实际问题产生装置(104)读取的个人信息选择性地生成实际问题,并通过再现装置(105)再现实际问题,从而防止各个受试者的不诚实行为。

    MOTION ESTIMATION DEVICE, MOTION ESTIMATION METHOD, AND MOTION ESTIMATION PROGRAM
    3.
    发明申请
    MOTION ESTIMATION DEVICE, MOTION ESTIMATION METHOD, AND MOTION ESTIMATION PROGRAM 审中-公开
    运动估计装置,运动估计方法和运动估计方案

    公开(公告)号:US20100086053A1

    公开(公告)日:2010-04-08

    申请号:US12596852

    申请日:2008-04-03

    IPC分类号: H04N7/26 H04N5/00

    摘要: A motion estimation device executes motion estimation for a macroblock in a current picture, using pixel data of a reference picture in a multi-frame memory (504), including the following elements. A local memory (702) holds a part of the pixel data. The part is in a first range from which motion is estimated in first motion estimation, and read out from the multi-frame memory (504). A common motion estimation unit (704) executes the first motion estimation using pixel data in the part held in the local memory (702). A direct motion estimation unit (108) executes the second motion estimation using pixel data in the pixel data of the reference picture by an algorithm different from that of the first motion estimation. The pixel data used by the direct motion estimation unit (108) is included in a second range which includes the first range and is larger than the first range.

    摘要翻译: 运动估计装置使用多帧存储器(504)中的参考图像的像素数据来执行当前图像中的宏块的运动估计,包括以下要素。 本地存储器(702)保存像素数据的一部分。 该部分处于从第一运动估计中估计运动的第一范围,并从多帧存储器读出(504)。 公共运动估计单元(704)使用保存在本地存储器(702)中的部分中的像素数据来执行第一运动估计。 直接运动估计单元(108)使用与第一运动估计不同的算法,使用参考图像的像素数据中的像素数据来执行第二运动估计。 由直接运动估计单元(108)使用的像素数据被包括在包括第一范围并且大于第一范围的第二范围内。

    Testing method for semiconductor device and testing circuit for semiconductor device
    4.
    发明申请
    Testing method for semiconductor device and testing circuit for semiconductor device 审中-公开
    半导体器件的测试方法和半导体器件的测试电路

    公开(公告)号:US20060041806A1

    公开(公告)日:2006-02-23

    申请号:US11098411

    申请日:2005-04-05

    IPC分类号: G01R31/28

    CPC分类号: G01R31/318594

    摘要: There is provided a testing method for a semiconductor device which has a test object circuit, a non-test object circuit, and a plurality of register circuits which carry out fetching and holding of data based on a clock signal, the semiconductor device including a plurality of first scan chains configured such that the register circuits in the test object circuit are serially connected, and a plurality of second scan chains configured such that the register circuits in the non-test object circuit are serially connected, the testing method including: providing test data to the first and second scan chains, and inputting the clock signal to the first scan chains, not inputting the clock signal to the second scan chains.

    摘要翻译: 提供一种半导体器件的测试方法,其具有测试对象电路,非测试对象电路以及基于时钟信号执行数据取出和保持的多个寄存器电路,该半导体器件包括多个 第一扫描链被配置为使得测试对象电路中的寄存器电路串联,并且多个第二扫描链被配置为使得非测试对象电路中的寄存器电路串联连接,所述测试方法包括:提供测试 数据到第一和第二扫描链,以及将时钟信号输入到第一扫描链,而不是将时钟信号输入到第二扫描链。