摘要:
In a listening comprehension test using individual examination execution devices, it is possible to avoid a dishonest act such as peeping at another examinee's answers. In an individual examination execution device (101), examination question data and individual information are read from an examination question storage means (102) that stores the examination questions and an individual information storage means (103) that stores the individual information, respectively, and actual questions that are selectively generated according to the individual information read by an actual question generation means (104) are reproduced by a reproduction means (105), thereby preventing dishonest acts of the respective examinees.
摘要:
In a listening comprehension test using individual examination execution devices, according to the present invention, it is possible to avoid a dishonest act such as peeping at another examinee's answers. An individual examination execution device (101) reads examination question data and individual information from an examination question storage means (102) storing the examination questions and an individual information storage means (103) storing the individual information, respectively. Further, the individual examination device selectively generates actual questions according to the individual information read by an actual question generation means (104), and reproduces the actual questions by a reproduction means (105), thereby preventing dishonest acts of respective examinees.
摘要:
A motion estimation device executes motion estimation for a macroblock in a current picture, using pixel data of a reference picture in a multi-frame memory (504), including the following elements. A local memory (702) holds a part of the pixel data. The part is in a first range from which motion is estimated in first motion estimation, and read out from the multi-frame memory (504). A common motion estimation unit (704) executes the first motion estimation using pixel data in the part held in the local memory (702). A direct motion estimation unit (108) executes the second motion estimation using pixel data in the pixel data of the reference picture by an algorithm different from that of the first motion estimation. The pixel data used by the direct motion estimation unit (108) is included in a second range which includes the first range and is larger than the first range.
摘要:
There is provided a testing method for a semiconductor device which has a test object circuit, a non-test object circuit, and a plurality of register circuits which carry out fetching and holding of data based on a clock signal, the semiconductor device including a plurality of first scan chains configured such that the register circuits in the test object circuit are serially connected, and a plurality of second scan chains configured such that the register circuits in the non-test object circuit are serially connected, the testing method including: providing test data to the first and second scan chains, and inputting the clock signal to the first scan chains, not inputting the clock signal to the second scan chains.