摘要:
A light emitting element includes a reflective layer disposed in a substrate, a first electrode disposed through the reflective layer, a second electrode having translucent reflectivity, a plurality of organic material layers including a light emitting layer disposed between the first electrode and the second electrode, and a light emitting region defined by the first electrode, the second electrode, and the light emitting layer. A first organic material layer of the plurality of organic material layers has a first layer thickness in a first sub region within the light emitting region and has a second layer thickness, which is different from the first layer thickness, in a second sub region within the light emitting region.
摘要:
In the case where measurement/inspection of a wafer is performed in a measurement/inspection instrument before and after exposure is performed in an exposure apparatus, various kinds of conditions of the exposure apparatus and the measurement/inspection instrument are made to be matched. In particular, in accordance with a processing state of the exposure apparatus and a coater developer, a measurement result of a film, and the like, exclusion of a mark for overlay error measurement, adjustment of the measurement condition and correction of the measurement result, adjustment of the environment, correction of the measurement result according to the environment, and adjustment of pattern defect inspection are performed. Further, in calibration processing, aberration of a projection optical system of an exposure apparatus that transfers a pattern on a wafer for calibration, and the like are also taken into consideration. Accordingly, the yield of device production can be improved.
摘要:
Provided is a light-emitting element including a cathode; an anode; a first light-emitting layer that is disposed between the cathode and the anode and emits in a first color; a second light-emitting layer that is disposed between the first light-emitting layer and the cathode and emits in a second color that is different from the first color; and an intermediate layer that is disposed between the first light-emitting layer and the second light-emitting layer so as to be in contact with these layers and has a function of controlling the migration of holes and electrons between the first light-emitting layer and the second light-emitting layer. The intermediate layer is constituted of a first layer that is in contact with the first light-emitting layer and is constituted of a hole-transporting material serving as a main material and a second layer that is in contact with the first layer and also with the second light-emitting layer and is constituted of a material mixture, serving as a main material, of a material having an acene skeleton and a hole-transporting material.
摘要:
A light-emitting device includes a cathode, an anode, a first light-emitting layer that is disposed between the cathode and the anode and that emits light of a first color, a second light-emitting layer that is disposed between the first light-emitting layer and the cathode and that emits light of a second color different from the first color, and an intermediate layer that is disposed between and in contact with the first light-emitting layer and the second light-emitting layer and that functions to prevent energy transfer of excitons between the first light-emitting layer and the second light-emitting layer. The intermediate layer contains an acene-based material and an amine-based material.
摘要:
A support device that is provided in a device manufacturing plant collects data from a device processing apparatus and analyzes the operating state and the like of the device processing apparatus based on the collected data. This support device consists of a data collection condition setting portion (231) that sets collection conditions of data to be used by the device processing apparatus; a statistical processing condition setting portion (232) that sets the processing condition of statistical processing to be performed on the collected data; and a graph display condition setting portion (233) that sets display conditions for displaying the collected data or the processing result of the statistical processing.
摘要:
Provided is a light-emitting element including a cathode; an anode; a first light-emitting layer that is disposed between the cathode and the anode and emits in a first color; a second light-emitting layer that is disposed between the first light-emitting layer and the cathode and emits in a second color that is different from the first color; and an intermediate layer that is disposed between the first light-emitting layer and the second light-emitting layer so as to be in contact with these layers and has a function of controlling the migration of holes and electrons between the first light-emitting layer and the second light-emitting layer. The intermediate layer is constituted of a first layer that is in contact with the first light-emitting layer and is constituted of a hole-transporting material serving as a main material and a second layer that is in contact with the first layer and also with the second light-emitting layer and is constituted of a material mixture, serving as a main material, of a material having an acene skeleton and a hole-transporting material.
摘要:
A light-emitting element includes a cathode, an anode, a first light-emitting layer disposed between the cathode and the anode, a second light-emitting layer disposed between the first light-emitting layer and the cathode, a third light-emitting layer disposed between the second light-emitting layer and the cathode, a first interlayer disposed between the first and second light-emitting layers that has a function of preventing energy transfer of an exciton between the first and second light-emitting layers, and a second interlayer disposed between the second and third light-emitting layers that has a function of preventing energy transfer of an exciton between the second and third light-emitting layers, wherein the first interlayer has a hole-transporting property higher than that of the second interlayer, and the second interlayer has a electron-transporting property higher than that of the first interlayer.
摘要:
An organic electroluminescent device includes a substrate on which a pixel region is disposed, and a partition structure including a stack of an inorganic partition made of an inorganic material and an organic partition made of an organic material, and an inorganic protective layer made of an inorganic material covering the surfaces of the organic partition. The partition structure surrounds the pixel region. A pixel electrode is in contact with the partition structure. An organic luminescent layer is disposed over the pixel electrode and covered with a cathode.
摘要:
A light-emitting device includes a cathode, an anode, a first light-emitting layer that is disposed between the cathode and the anode and that emits light of a first color, a second light-emitting layer that is disposed between the first light-emitting layer and the cathode and that emits light of a second color different from the first color, and an intermediate layer that is disposed between and in contact with the first light-emitting layer and the second light-emitting layer and that functions to prevent energy transfer of excitons between the first light-emitting layer and the second light-emitting layer. The intermediate layer includes a first intermediate layer disposed in contact with the first light-emitting layer and mainly containing a first intermediate material and a second intermediate layer disposed in contact with the second light-emitting layer and mainly containing a second intermediate material different from the first intermediate material.
摘要:
In the case where measurement/inspection of a wafer is performed in a measurement/inspection instrument before and after exposure is performed in an exposure apparatus, various kinds of conditions of the exposure apparatus and the measurement/inspection instrument such as environment in the apparatus/instrument, a measurement condition of an alignment system a measurement condition of an AF measurement device, a wafer grid, and image distortion are made to be matched. In particular, in accordance with a processing state of the exposure apparatus and a coater developer, a measurement result of a film, and the like, exclusion of a mark for overlay error measurement, adjustment of the measurement condition and correction of the measurement result, adjustment of the environment, correction of the measurement result according to the environment, and adjustment of pattern defect inspection are performed. Further, in calibration processing, aberration of a projection optical system of an exposure apparatus that transfers a pattern on a wafer for calibration, and the like are also taken into consideration. Accordingly, the yield of device production can be improved.