公开(公告)号：US20050169089A1

公开(公告)日：2005-08-04

申请号：US11022516

申请日：2004-12-23

Applicant: Matteo Patelmo ,  Rosario Portoghese ,  Massimo Bassi ,  Stefano Scuratti

Inventor： Matteo Patelmo ,  Rosario Portoghese ,  Massimo Bassi ,  Stefano Scuratti

IPC: G11C5/00 ,  G11C29/00 ,  G11C29/50

CPC classification number: G11C29/006 ,  G11C11/41 ,  G11C29/50 ,  G11C2029/0401 ,  G11C2029/0405 ,  G11C2029/5006

Abstract: A method for locating in an array of memory cells a set of cells having a stand-by current that exceeds a certain value based on their programming state. The method includes selecting all the cells of the array of memory cells as a set of cells to be tested, and dividing the set of cells to be tested into subsets of cells, and repeatedly sensing a stand-by current absorbed by the array of memory cells after having changed the programming state of the subsets of cells. The sensed stand-by currents are compared and a subset of cells having a stand-by current exceeding the certain value are identified as a function of the comparison. The identified subset of cells is selected as a new set of cells to be tested, and the method is repeated. Otherwise, the testing stops with the just tested subset of cells having a stand-by current exceeding the certain value.

Abstract translation: 一种用于在存储器单元的阵列中定位具有基于其编程状态超过一定值的待机电流的一组单元的方法。 该方法包括将存储单元阵列的所有单元格选择为要测试的单元的集合，并将要测试的单元组划分为单元子集，并且重复地感测由存储器阵列吸收的备用电流 改变了细胞子集的编程状态后的细胞。 比较感测到的备用电流，并将具有超过特定值的待机电流的电池子集识别为比较的函数。 选择识别的细胞子集作为要测试的新的细胞集合，并重复该方法。 否则，测试停止，刚刚测试的具有超过特定值的待机电流的单元的子集。

公开(公告)号：US07072239B2

公开(公告)日：2006-07-04

申请号：US11022516

申请日：2004-12-23

Applicant: Matteo Patelmo ,  Rosario Portoghese ,  Massimo Bassi ,  Stefano Scuratti

Inventor： Matteo Patelmo ,  Rosario Portoghese ,  Massimo Bassi ,  Stefano Scuratti

IPC: G11C7/00

CPC classification number: G11C29/006 ,  G11C11/41 ,  G11C29/50 ,  G11C2029/0401 ,  G11C2029/0405 ,  G11C2029/5006

Abstract: A method for locating in an array of memory cells a set of cells having a stand-by current that exceeds a certain value based on their programming state. The method includes selecting all the cells of the array of memory cells as a set of cells to be tested, and dividing the set of cells to be tested into subsets of cells, and repeatedly sensing a stand-by current absorbed by the array of memory cells after having changed the programming state of the subsets of cells. The sensed stand-by currents are compared and a subset of cells having a stand-by current exceeding the certain value are identified as a function of the comparison. The identified subset of cells is selected as a new set of cells to be tested, and the method is repeated. Otherwise, the testing stops with the just tested subset of cells having a stand-by current exceeding the certain value.

Abstract translation: 一种用于在存储器单元的阵列中定位具有基于其编程状态超过一定值的待机电流的一组单元的方法。 该方法包括将存储单元阵列的所有单元格选择为要测试的单元的集合，并将要测试的单元组划分为单元子集，并且重复地感测由存储器阵列吸收的备用电流 改变了细胞子集的编程状态后的细胞。 比较感测到的备用电流，并且将具有超过特定值的待机电流的电池子集识别为比较的函数。 选择识别的细胞子集作为要测试的新的细胞集合，并重复该方法。 否则，测试停止，刚刚测试的具有超过特定值的待机电流的单元的子集。