Device for examining workpieces
    2.
    发明申请
    Device for examining workpieces 审中-公开
    检查工件的装置

    公开(公告)号:US20090207243A1

    公开(公告)日:2009-08-20

    申请号:US11990626

    申请日:2006-08-16

    IPC分类号: H04N7/18 G06K9/00

    摘要: The invention relates to a device for examining workpieces (6), in particular, circuit cards, comprising an examination tool, which is clamped to the measuring head (2), which can be displaced in relation to the workpiece (6) on a workpiece plane, and also comprising an optical observation device which is used to control the measuring head (2). The optical observation device is embodied as a camera (5), which is mounted on the measuring head (2) and which comprises an optical axis (5a), such that a simple, rapid and reliable measurement can be carried out. Said axis is essentially perpendicular to the workpiece plane (6a), and a calibration device is provided in order to determine the mechanical offset (d) which is the distance of the tool (3) from the optical axis (5a) of the camera (5). The invention also relates to a method which can be carried out using the above-mentioned device.

    摘要翻译: 本发明涉及一种用于检查工件(6)的装置,特别是用于检查电路卡的装置,该装置包括夹紧在测量头(2)上的检查工具,该检查工具可相对于工件(6)在工件上移位 并且还包括用于控制测量头(2)的光学观察装置。 光学观察装置被实现为安装在测量头(2)上并包括光轴(5a)的相机(5),使得可以进行简单,快速和可靠的测量。 所述轴线基本上垂直于工件平面(6a),并且提供校准装置以便确定作为工具(3)距相机的光轴(5a)的距离的机械偏移(d) 5)。 本发明还涉及可以使用上述装置进行的方法。