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公开(公告)号：US5126661A
公开(公告)日：1992-06-30
申请号：US599579
申请日：1990-10-18
IPC分类号： G01J1/44 , G01R19/00 , G01R31/302 , G01R31/308 , H01L21/66
CPC分类号： G01R31/308
摘要： An integrated circuit (11) is tested at a high microwave frequency through the use of a laser beam (19) having a repetition rate much lower than the test frequency. Electric fields of the test signal extend into an electro-optic material (12) that modulates part of the laser beam. Another part of the laser beam is converted to an electrical pulsed signal that is applied to a microwave mixer (33) along with part of the test frequency signal. A harmonic of the pulsed signal mixes with the test frequency to yield a difference frequency that can be used as a phase reference for analyzing the phase of the test signal. The component pulses (30) of the laser beam have a pulse width which is much shorter than the separation of the pulses, which make it inherently rich in higher harmonics of the fundamental pulse repetition rate.
摘要翻译： 通过使用具有比测试频率低得多的重复率的激光束（19），以高微波频率测试集成电路（11）。 测试信号的电场延伸到调制激光束的一部分的电光材料（12）中。 激光束的另一部分被转换成电脉冲信号，该电脉冲信号连同部分测试频率信号一起施加到微波混合器（33）。 脉冲信号的谐波与测试频率混合，产生可用作分析测试信号相位的相位基准的差分频率。 激光束的分量脉冲（30）具有比脉冲分离短得多的脉冲宽度，这使得其固有地富含基波脉冲重复频率的高次谐波。
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公开(公告)号：US5042040A
公开(公告)日：1991-08-20
申请号：US502096
申请日：1990-03-30
CPC分类号： H01S3/08036 , H01S3/094034 , H01S3/1115 , H01S2301/02 , H01S3/0078
摘要： Amplitude noise is dramatically reduced in an optically pumped modelocked laser arrangement by incorporating an intra-cavity or external cavity mode selection element with a continuous-wave pump laser coupled optically to a modelocked laser. The mode selection element causes a light beam generated from the pump laser to operate nominally at a single frequency, that is, substantially a single longitudinal mode. Mode selection may be realized with an air-spaced or solid material Fabry-Perot etalon.
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公开(公告)号：US5581190A
公开(公告)日：1996-12-03
申请号：US434875
申请日：1995-04-29
CPC分类号： G01R31/2822 , G01R27/28
摘要： An RF device (12), such as an amplifier, is tested by applying a digitally-modulated RF stimulus signal, having a known magnitude and phase angle, to the device to cause it to generate a response signal. The response signal of the device is down-converted and digitized prior to establishing its magnitude and phase angle. The magnitude and phase angle of the digitized, down-converted response signal are compared to the magnitude and phase angle, respectively, of the digitally-modulated stimulus signal to yield transfer functions indicative of the operation of the device.
摘要翻译： 诸如放大器的RF装置（12）通过将具有已知幅度和相位角的数字调制的RF激励信号施加到装置来使其产生响应信号而被测试。 在建立其幅度和相位角之前，器件的响应信号被下变频和数字化。 将数字化，下变频的响应信号的幅度和相位角分别与数字调制的刺激信号的幅度和相位角进行比较，以产生指示器件操作的传输函数。
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4.发明授权Method and apparatus for integrated testing of a system containing digital and radio frequency circuits 失效用于包含数字和射频电路的系统的集成测试的方法和装置
公开(公告)号：US5481186A
公开(公告)日：1996-01-02
申请号：US317070
申请日：1994-10-03
申请人： Michael S. Heutmaker , Madhuri Jarwala , Duy K. Le
发明人： Michael S. Heutmaker , Madhuri Jarwala , Duy K. Le
CPC分类号： G01R31/2822 , G01R31/318536 , H04B17/15 , H04B17/21 , H04B17/16 , H04B17/19
摘要： A method is provided for accomplishing unified testing of a digital/RF system (10'), comprised of a digital controller (14), a base-band processor (20), an RF transmitter (24) and an RF receiver (34). The digital portion of the digital/RF system (10'), including the digital controller (14) and the base-band processor (20), is tested by a digital test technique such as Boundary-Scan testing. Test patterns for the RF elements are down-loaded from the digital controller (14) to the base-band processor via a Boundary-Scan Test Access Port (TAP). Thereafter, the RF transmitter (24) and the RF receiver (34) are tested by applying the test patterns from the base-band processor to the RF transmitter for transmission thereby. The signal produced by the RF transmitter (24) in response to the applied test pattern is converted to a first digital signal stream for processing by the base-band processor (20) to determine the operability of the transmitter. The signal produced by the RF transmitter (24) is also received by the RF receiver (34) for demodulation thereby. The demodulated receiver signal is then converted to a second signal stream for input to the base-band processor to determine the operability of the receiver.
摘要翻译： 提供了一种用于完成数字/ RF系统（10'）的统一测试的方法，数字/ RF系统（10'）包括数字控制器（14），基带处理器（20），RF发射器（24）和RF接收器（34） 。 包括数字控制器（14）和基带处理器（20）的数字/ RF系统（10'）的数字部分通过诸如边界扫描测试的数字测试技术进行测试。 RF元件的测试模式通过边界扫描测试访问端口（TAP）从数字控制器（14）下载到基带处理器。 此后，通过将来自基带处理器的测试模式应用于RF发射器来测试RF发射器（24）和RF接收器（34），以便传输。 由RF发射机（24）响应于所应用的测试模式产生的信号被转换为第一数字信号流，以便由基带处理器（20）处理以确定发射机的可操作性。 由RF发射机（24）产生的信号也由RF接收器（34）接收以进行解调。 然后将解调的接收机信号转换为第二信号流，以输入到基带处理器，以确定接收机的可操作性。
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5.发明授权Method and system for correcting phase and amplitude imbalances of a quadrature modulated RF signal 有权用于校正正交调制RF信号的相位和幅度不平衡的方法和系统公开(公告)号：US06512800B1
公开(公告)日：2003-01-28
申请号：US09267280
申请日：1999-03-12
IPC分类号： H04K102
CPC分类号： H04L27/364
摘要： A method for correcting the phase and amplitude imbalance of a quadrature modulated RF signal requires that errors be induced in both amplitude, &rgr;, and in phase &phgr; in at least three different combinations in order to determine the appropriate correction value for amplitude and phase offsets &Dgr; and &thgr;e. According to a first embodiment the same &rgr; and &phgr; offsets applied in three different combinations to determine the necessary &Dgr; and &thgr;e corrections. According to a second embodiment, a fourth measurement is made in order to determine an unknown control scale factor for balance adjustments.
摘要翻译： 用于校正正交调制RF信号的相位和幅度不平衡的方法要求在至少三种不同组合中的振幅，rho和相位phi中都会引起误差，以便确定振幅和相位偏移的适当校正值DELTA 和thetae。 根据第一实施例，以三种不同的组合应用相同的rho和phi偏移量来确定必要的DELTA和θe校正。 根据第二实施例，进行第四测量以便确定用于平衡调整的未知控制比例因子。
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6.发明授权Method and system for DC offset correction of a quadrature modulated RF signal 有权用于正交调制RF信号的直流偏移校正的方法和系统公开(公告)号：US06434204B1
公开(公告)日：2002-08-13
申请号：US09262260
申请日：1999-03-04
IPC分类号： H03D104
CPC分类号： H04L27/2071 , H04L2027/0016 , H04L2027/0018
摘要： The DC offset error of a quadrature modulated RF signal is corrected by introducing a specific trial offset correction value, D, into the DC offset correction circuits 3, 4 or 5 times, by measuring the carrier power resulting from each trial introduction, and by using the information to determine the DC offset correction components, Icor and Qcor. According to an ideal case first embodiment, specific offset D is employed in three different measurement combinations to determine the correction factors Icor and Qcor. According to an alternative embodiment, a fourth offset correction measurement, needed to estimate a single offset control scale factor, is used to account for an unknown power scale factor A. According to a second alternative embodiment, five offset correction measurements are used to account for separate offset control scale factors for the I and Q channels.
摘要翻译： 正交调制RF信号的DC偏移误差通过将特定的试验偏移校正值D引入到DC偏移校正电路3,4或5次中，通过测量每个试用引入的载波功率，并通过使用 该信息确定DC偏移校正组件，Icor和Qcor。 根据理想情况第一实施例，在三种不同的测量组合中采用特定偏移量D来确定校正因子Icor和Qcor。 根据替代实施例，用于估计单个偏移控制比例因子所需的第四偏移校正测量用于考虑未知功率标度因子A.根据第二替代实施例，使用五个偏移校正测量来计算 单独的偏移控制比例因子为I和Q通道。
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公开(公告)号：US5126660A
公开(公告)日：1992-06-30
申请号：US636782
申请日：1991-01-02
IPC分类号： G01R19/00 , G01R31/302 , G01R31/308 , G02F1/15 , H01L21/66 , H01S3/107
CPC分类号： G01R31/308
摘要： An integrated circuit device (11) is tested by directing a laser beam (19) onto an electrochromic member (17) in close proximity to a conductor (13) of the integrated circuit. Reflected laser light is directed to a detector (21) which converts it to an electrical signal for display by a lock-in amplifier (25). The display characterizes the voltage on the conductor (17) and thereby permits diagnosis of the operation of the integrated circuit (11).
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