公开(公告)号：US20120112777A1

公开(公告)日：2012-05-10

申请号：US13383537

申请日：2009-07-14

申请人： Mitsunori Aizawa ,  Akihiko Ito ,  Noboru Masuda

发明人： Mitsunori Aizawa ,  Akihiko Ito ,  Noboru Masuda

IPC分类号： G01R31/00

CPC分类号： G01R31/2893 ,  G01R31/2867

摘要： An electronic device pushing apparatus includes a pushing unit which has: a plurality of pushers which contact DUTs; and base plate on which the plurality of pushers are provided. A rigidity of the base plate is set to a rigidity which is lower relative to the rigidity of a spacing frame of the HIFIX.

摘要翻译： 电子设备推送装置包括：推动单元，其具有：多个与DUT接触的推动器; 以及设置有多个推动器的基板。 基板的刚性设定为相对于HIFIX的间隔框架的刚性较低的刚性。

公开(公告)号：US20070296419A1

公开(公告)日：2007-12-27

申请号：US11791165

申请日：2005-11-22

申请人： Mitsunori Aizawa ,  Akihiko Ito

发明人： Mitsunori Aizawa ,  Akihiko Ito

IPC分类号： G01R1/04 ,  G01R31/00

CPC分类号： G01R31/2893

摘要： Two electronic device holding portions 19 are formed on an insert to be attached to a test tray TST of an electronic device handling apparatus 1, and the two electronic device holding portions 19 are arranged at positions sandwiching a standard hole 20a used as a positional standard when aligning. When using an insert having a plurality of electronic device holding portions 19, the number of IC devices 2 to be held per a unit area on the test tray TST increases and the throughput improves. Also, when arranging the two electronic device holding portions 19 at positions sandwiching the standard hole 20a, both of the electronic device holding portions 19 can be close to the standard hole 20a, so that positional deviation of the IC devices 2 caused by thermal expansion or thermal contraction of the insert 16 can be suppressed and arising of contact mistakes caused by positional deviation is suppressed.

摘要翻译： 两个电子装置保持部分19形成在插入件上以安装在电子装置处理装置1的试纸盘TST上，并且两个电子装置保持部分19被布置在夹着用作位置标准的标准孔20a的位置 对齐时。 当使用具有多个电子设备保持部分19的插入件时，待测托盘TST上每单位区域保持的IC器件2的数量增加并且吞吐量提高。 此外，当将两个电子设备保持部分19布置在夹着标准孔20a的位置时，两个电子设备保持部分19都可以靠近标准孔20a，使得IC器件2由热量引起的位置偏差 可以抑制插入件16的膨胀或热收缩，并抑制由位置偏差引起的接触错误。