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公开(公告)号：US20110314336A1
公开(公告)日：2011-12-22
申请号：US12818003
申请日：2010-06-17
申请人： Sunny Wu , Yen-Di Tsen , Monghsung Chuang , Fu-Min Huang , Jo Fei Wang , Jong-I Mou
发明人： Sunny Wu , Yen-Di Tsen , Monghsung Chuang , Fu-Min Huang , Jo Fei Wang , Jong-I Mou
IPC分类号： G06F11/07
CPC分类号： G01R31/2894
摘要： A method includes providing a plurality of failure dies, and performing a chip probing on the plurality of failure dies to generate a data log comprising electrical characteristics of the plurality of failure dies. An automatic net tracing is performed to trace failure candidate nodes in the failure dies. A failure layer analysis is performed on results obtained from the automatic net tracing. Physical failure analysis (PFA) samples are selected from the plurality of failure dies using results obtained in the step of performing the failure layer analysis.
摘要翻译： 一种方法包括提供多个故障管芯，并对多个故障管芯进行芯片探测以产生包括多个故障管芯的电气特性的数据记录。 执行自动网络跟踪以跟踪故障模块中的故障候选节点。 对从自动网络跟踪获得的结果执行故障层分析。 使用在执行故障层分析的步骤中获得的结果从多个故障模具中选择物理故障分析（PFA）样本。
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公开(公告)号：US08205173B2
公开(公告)日：2012-06-19
申请号：US12818003
申请日：2010-06-17
申请人： Sunny Wu , Yen-Di Tsen , Monghsung Chuang , Fu-Min Huang , Jo Fei Wang , Jong-I Mou
发明人： Sunny Wu , Yen-Di Tsen , Monghsung Chuang , Fu-Min Huang , Jo Fei Wang , Jong-I Mou
CPC分类号： G01R31/2894
摘要： A method includes providing a plurality of failure dies, and performing a chip probing on the plurality of failure dies to generate a data log comprising electrical characteristics of the plurality of failure dies. An automatic net tracing is performed to trace failure candidate nodes in the failure dies. A failure layer analysis is performed on results obtained from the automatic net tracing. Physical failure analysis (PFA) samples are selected from the plurality of failure dies using results obtained in the step of performing the failure layer analysis.
摘要翻译： 一种方法包括提供多个故障管芯，并对多个故障管芯进行芯片探测以产生包括多个故障管芯的电气特性的数据记录。 执行自动网络跟踪以跟踪故障模块中的故障候选节点。 对从自动网络跟踪获得的结果执行故障层分析。 使用在执行故障层分析的步骤中获得的结果从多个故障模具中选择物理故障分析（PFA）样本。
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