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    System and method for developing production nano-material
    1.
    发明授权
    System and method for developing production nano-material 失效
    开发生产纳米材料的系统和方法

    公开(公告)号：US07235421B2

    公开(公告)日：2007-06-26

    申请号：US10944481

    申请日：2004-09-16

    申请人： Nasreen G. Chopra

    发明人： Nasreen G. Chopra

    IPC分类号： H01I51/40

    CPC分类号： B82B3/009 ,  B82Y40/00 ,  H01L23/373 ,  H01L2924/0002 ,  H01L2924/00

    摘要： A method for developing a manufacturing process includes measuring, in a first testing environment, a primary property of a nano-engineered material at one or more positions to provide one or more measurements. The method also includes determining whether the one or more measurements satisfy a first tolerance criterion and taking a further action based on whether the one or more measurements satisfy the first tolerance criterion. Additionally, a method of measuring thermal properties of a nano-engineered material includes irradiating a nano-engineered material with laser radiation, wherein the laser radiation impinges on a first surface of the nano-engineered material at one ore more locations, capturing at least one image of the nano-engineered material, and analyzing the at least one image to characterize the thermal properties of the nano-engineered material.

    摘要翻译： 用于开发制造工艺的方法包括在第一测试环境中测量纳米工程材料在一个或多个位置的主要性质以提供一个或多个测量。 所述方法还包括确定所述一个或多个测量是否满足第一公差标准，并且基于所述一个或多个测量是否满足所述第一公差标准来采取进一步的动作。 另外，测量纳米工程材料的热性质的方法包括用激光辐射照射纳米工程材料，其中激光辐射在一个或多个位置处撞击纳米工程材料的第一表面，捕获至少一个 纳米工程材料的图像，以及分析至少一个图像以表征纳米工程材料的热性质。