Chip design and fabrication method optimized for profit
    3.
    发明授权
    Chip design and fabrication method optimized for profit 有权
    芯片设计和制造方法优化利润

    公开(公告)号:US08086988B2

    公开(公告)日:2011-12-27

    申请号:US12467326

    申请日:2009-05-18

    IPC分类号: G06F9/455 G06F17/50

    CPC分类号: G06F17/5045 G06F17/5031

    摘要: Disclosed is a computer-implemented method for designing a chip to optimize yielding parts in different bins as a function of multiple diverse metrics and further to maximize the profit potential of the resulting chip bins. The method separately calculates joint probability distributions (JPD), each JPD being a function of a different metric (e.g., performance, power consumption, etc.). Based on the JPDs, corresponding yield curves are generated. A profit function then reduces the values of all of these metrics (e.g., performance values, power consumption values, etc.) to a common profit denominator (e.g., to monetary values indicating profit that may be associated with a given metric value). The profit function and, more particularly, the monetary values can be used to combine the various yield curves into a combined profit-based yield curve from which a profit model can be generated. Based on this profit model, changes to the chip design can be made in order to optimize yield as a function of all of the diverse metrics (e.g., performance, power consumption, etc.) and further to maximize the profit potential of the resulting chips.

    摘要翻译: 公开了一种计算机实现的方法,用于设计芯片以优化不同仓中的产量部分作为多个不同度量的函数,并进一步最大化所得到的芯片仓的利润潜力。 该方法分别计算联合概率分布(JPD),每个JPD是不同度量(例如,性能,功耗等)的函数。 基于JPD,生成相应的收益率曲线。 利润函数然后将所有这些度量(例如,绩效值,功耗值等)的值减小到公共利润分母(例如,指示可能与给定度量值相关联的利润的货币值)。 更具体地说,利润函数,尤其是货币价值可用于将各种收益率曲线组合成基于利润的收益率曲线,从中可以生成利润模型。 基于这种利润模型,可以对芯片设计进行改变,以便根据所有不同的指标(例如性能,功耗等)来优化产量,并进一步最大化所得芯片的利润潜力 。

    CHIP DESIGN AND FABRICATION METHOD OPTIMIZED FOR PROFIT
    4.
    发明申请
    CHIP DESIGN AND FABRICATION METHOD OPTIMIZED FOR PROFIT 有权
    芯片设计和优化方法优化

    公开(公告)号:US20100293512A1

    公开(公告)日:2010-11-18

    申请号:US12467326

    申请日:2009-05-18

    IPC分类号: G06F17/50

    CPC分类号: G06F17/5045 G06F17/5031

    摘要: Disclosed is a computer-implemented method for designing a chip to optimize yielding parts in different bins as a function of multiple diverse metrics and further to maximize the profit potential of the resulting chip bins. The method separately calculates joint probability distributions (JPD), each JPD being a function of a different metric (e.g., performance, power consumption, etc.). Based on the JPDs, corresponding yield curves are generated. A profit function then reduces the values of all of these metrics (e.g., performance values, power consumption values, etc.) to a common profit denominator (e.g., to monetary values indicating profit that may be associated with a given metric value). The profit function and, more particularly, the monetary values can be used to combine the various yield curves into a combined profit-based yield curve from which a profit model can be generated. Based on this profit model, changes to the chip design can be made in order to optimize yield as a function of all of the diverse metrics (e.g., performance, power consumption, etc.) and further to maximize the profit potential of the resulting chips.

    摘要翻译: 公开了一种计算机实现的方法,用于设计芯片以优化不同仓中的产量部分作为多个不同度量的函数,并进一步最大化所得到的芯片仓的利润潜力。 该方法分别计算联合概率分布(JPD),每个JPD是不同度量(例如,性能,功耗等)的函数。 基于JPD,生成相应的收益率曲线。 利润函数然后将所有这些度量(例如,绩效值,功耗值等)的值减小到公共利润分母(例如,指示可能与给定度量值相关联的利润的货币值)。 更具体地说,利润函数,尤其是货币价值可用于将各种收益率曲线组合成基于利润的收益率曲线,从中可以产生利润模型。 基于这种利润模型,可以对芯片设计进行改变,以便根据所有不同的指标(例如性能,功耗等)来优化产量,并进一步最大化所得芯片的利润潜力 。