Thin-film solar cells on the basis of IB-IIIA-VIA compound semiconductors and method for manufacturing same
    2.
    发明授权
    Thin-film solar cells on the basis of IB-IIIA-VIA compound semiconductors and method for manufacturing same 失效
    基于IB-IIIA-VIA复合半导体的薄膜太阳能电池及其制造方法

    公开(公告)号:US06429369B1

    公开(公告)日:2002-08-06

    申请号:US09567932

    申请日:2000-05-10

    IPC分类号: H01L310264

    摘要: The invention relates to a thin-film solar cell on the basis of IB-IIIA-VIA compound semiconductors and a method for producing such a solar cell. Between the polycrystalline IB-IIIA-VIA absorber layer of the p-type conductivity and the carrier film serving as a substrate, a back electrode of intermetallic phases of the same IB- and IIIA-metals are located which are deposited for the generation of the absorber layer. The absorber layer and the back electrode are produced in such a way that the precursor consisting of IB-IIIA-metals is vertically only incompletely converted into the photovoltaicly active absorber material from the side opposite to the carrier film by reaction with chalcogen such that intermetallic phases of the IB- and IIIA-metals are directly located on the carrier film, which metals serve as back electrode of the solar cell structure.

    摘要翻译: 本发明涉及一种基于IB-IIIA-VIA化合物半导体的薄膜太阳能电池及其制造方法。 在p型电导率的多晶IB-IIIA-VIA吸收层与作为基底的载体膜之间,位于相同的IB-和IIIA-金属的金属间相的背面电极,其沉积用于产生 吸收层。 吸收层和背面电极的制造方法是使由IB-IIIA金属构成的前体从与载体膜相反的一侧垂直地不完全转化为光电活性吸收材料,与硫族元素反应,使得金属间相 的IBA和IIIA金属直接位于载体膜上,这些金属用作太阳能电池结构的背电极。

    System and method for localizing and passivating defects in a photovoltaic element
    3.
    发明申请
    System and method for localizing and passivating defects in a photovoltaic element 审中-公开
    用于定位和钝化光伏元件中的缺陷的系统和方法

    公开(公告)号:US20110156716A1

    公开(公告)日:2011-06-30

    申请号:US13060412

    申请日:2009-08-28

    IPC分类号: G01R31/26

    CPC分类号: H02S50/10 G01R31/025

    摘要: The present invention relates to a system and method for localizing defects causing leakage currents in a photovoltaic element (100), a system and method for passivating defects causing leakage currents in a photovoltaic element and a system and method for passivating a shunt in a roll-to-roll photovoltaic element comprising the steps of illuminating an area (130), having at least a minimum size, of the photovoltaic element; measuring at least one electrical value of an electrical potential between electrodes of the photovoltaic element at least one specific measurement position within the illuminated area on one of the electrodes of the photovoltaic element; and determining a position of a defect based on the measured at least one photomduced electrical value and the at least one specific measurement position.

    摘要翻译: 本发明涉及用于定位导致光电元件(100)中的漏电流的缺陷的系统和方法,用于钝化导致光伏元件中的漏电流的缺陷的系统和方法以及用于钝化光伏元件中的分流的方法, 所述光伏元件包括以下步骤:照射具有至少最小尺寸的光伏元件的区域(130); 测量所述光伏元件的电极之间的电位的至少一个电值,所述光电元件的所述电极中的一个电极中的所述照明区域内的至少一个特定测量位置; 以及基于所测量的至少一个光致电值和所述至少一个特定测量位置来确定缺陷的位置。