公开(公告)号：US06414483B1

公开(公告)日：2002-07-02

申请号：US09627049

申请日：2000-07-27

申请人： Shridhar Champaknath Nath ,  Thomas James Batzinger ,  Curtis Wayne Rose ,  Paul Peter Stryjek

发明人： Shridhar Champaknath Nath ,  Thomas James Batzinger ,  Curtis Wayne Rose ,  Paul Peter Stryjek

IPC分类号： G01N2782

CPC分类号： G01N27/9006

摘要： A method of inspecting a preselected area of an electrically conductive component to determine whether flaws are present. The method includes the steps of permanently mounting an eddy current element on the component over the preselected area and energizing the element to generate alternating magnetic fields proximate the component. An electrical signal generated by a secondary magnetic field formed proximate the component is detected using the element and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw in the component. Inspection apparatus for performing this method is also disclosed.

摘要翻译： 检查导电部件的预选区域以确定是否存在缺陷的方法。 该方法包括以下步骤：将涡流元件永久性地安装在预选区域上的部件上，并激励该元件以产生接近该部件的交变磁场。 使用元件检测由邻近分量形成的次级磁场产生的电信号，并将检测到的电信号与参考信号进行比较，以确定检测信号是否不同于参考信号。 差异表明组件中存在缺陷。 还公开了用于执行该方法的检查装置。