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1.发明申请Second-Order Nonlinear Susceptibility of a Nanoparticle Using Coherent Confocal Microscopy 有权使用相干共聚焦显微镜对纳米粒子的二阶非线性敏感性公开(公告)号：US20110267617A1
公开(公告)日：2011-11-03
申请号：US13154014
申请日：2011-06-06
CPC分类号： G01N21/636 , G01N21/23 , G01N2021/4792 , G02B21/0056
摘要： A coherent confocal microscope and methods for measuring elements of the non-linear susceptibility of a nanoparticle, including, more particularly, all of the elements of the second-order susceptibility tensor of a single nanoparticle under permutation and Kleinman symmetry. Using a high numerical aperture lens, two-dimensional scanning and a vector beam shaper, the second-order nonlinear susceptibility is derived from a single confocal image. A forward model for the problem is presented and a computationally efficient data processing method robustly solves the inverse problem.
摘要翻译： 一种相干共焦显微镜和用于测量纳米颗粒的非线性磁化率的元素的方法，更具体地，包括在排列和克莱曼对称下的单个纳米颗粒的二阶磁敏度张量的所有元素。 使用高数值孔径透镜，二维扫描和矢量光束整形器，从单个共焦图像导出二阶非线性磁化率。 提出了一个问题的前向模型，并且计算效率高的数据处理方法可以很好地解决逆问题。
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公开(公告)号：US06628747B1
公开(公告)日：2003-09-30
申请号：US10177429
申请日：2002-06-21
IPC分类号： G21K700
CPC分类号： G21K5/04
摘要： A methodology and concomitant system for three-dimensional near-field microscopy achieves subwavelength resolution of an object without retrieval of the optical phase. The features of this approach are three-fold: (i) the near-field phase problem is circumvented by employing measurements of the power extinguished from probe fields; (ii) the fields on which the power measurements are performed may be monitored far from the object and thus subwavelength resolution is obtained from far zone measurements; and (iii) by developing an analytic approach to the inverse problem in the form of an explicit inversion formula, an image reconstruction algorithm is produced which is strikingly robust in the presence of noise.
摘要翻译： 三维近场显微镜的方法学和伴随系统在没有光学相位的检索的情况下实现了物体的亚波长分辨率。 这种方法的特点是三重的：（i）通过对从探头场熄灭的电力进行测量来规避近场相位问题; （ii）进行功率测量的场可以远离物体进行监测，从而从远区测量获得亚波长分辨率; 并且（iii）通过以明确的反转公式的形式开发对逆问题的分析方法，产生在存在噪声的情况下显着稳健的图像重建算法。
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公开(公告)号：US20130345558A1
公开(公告)日：2013-12-26
申请号：US14001556
申请日：2012-03-01
IPC分类号： A61B5/00
摘要： An intraoperative probe and a system for optically imaging a surgically significant volume of tissue or other scattering medium. An illumination source generates an illuminating beam that is conveyed to the vicinity of the tissue and a beam splitter, that may be no more than an optical phase reference, splits the illuminating beam into a sample beam along a sample beam path and a reference beam along a reference beam path. A scanning mechanism scans a portion of the sample beam across a section of the scattering medium, while a detector detects return beams from both the reference beam path and the sample beam path and generates an interference signal. A processor computationally moves an effective focus of the sample beam without physical variation of focus of the sample beam. The probe may have a sterilizable fairing that may be detachable.
摘要翻译： 术中探针和用于光学地成像外科手术显着体积的组织或其它散射介质的系统。 照明源产生被传送到组织附近的照明光束，并且可以不超过光相位参考的分束器将照明光束沿着样本光束路径和参考光束沿着样本光束分裂 参考光束路径。 扫描机构扫描样品束的一部分横跨散射介质的一部分，而检测器检测来自参考光束路径和样本光束路径的返回光束，并产生干涉信号。 处理器计算地移动样本波束的有效焦点，而样品波束的焦点没有物理变化。 探头可以具有可拆卸的可消毒整流罩。
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公开(公告)号：US06775349B2
公开(公告)日：2004-08-10
申请号：US10045274
申请日：2001-10-23
IPC分类号： H05G100
CPC分类号： G01N21/4795
摘要： A method for the reconstruction of a tomographic image of an object from measurements of scattering data resulting from probing waves. The scattering data is related to a forward scattering operator by an integral operator. The tomographic image is reconstructed by executing a prescribed mathematical algorithm, as determined with reference to the integral operator, on the scattering data.
摘要翻译： 一种用于从由探测波产生的散射数据的测量中重建物体的断层图像的方法。 散射数据通过积分算子与前向散射算子有关。 通过执行在散射数据上参照积分算子确定的规定的数学算法来重建断层图像。
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公开(公告)号：US10813553B2
公开(公告)日：2020-10-27
申请号：US14001556
申请日：2012-03-01
摘要： An intraoperative probe and a system for optically imaging a surgically significant volume of tissue or other scattering medium. An illumination source generates an illuminating beam that is conveyed to the vicinity of the tissue and a beam splitter, that may be no more than an optical phase reference, splits the illuminating beam into a sample beam along a sample beam path and a reference beam along a reference beam path. A scanning mechanism scans a portion of the sample beam across a section of the scattering medium, while a detector detects return beams from both the reference beam path and the sample beam path and generates an interference signal. A processor computationally moves an effective focus of the sample beam without physical variation of focus of the sample beam. The probe may have a sterilizable fairing that may be detachable.
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6.发明申请Computational Adaptive Optics for Interferometric Synthetic Aperture Microscopy and Other Interferometric Imaging 有权用于干涉合成孔径显微镜和其他干涉成像的计算自适应光学公开(公告)号：US20140050382A1
公开(公告)日：2014-02-20
申请号：US13996838
申请日：2012-01-16
IPC分类号： G06T11/00
CPC分类号： G06T11/008 , G02B21/0056
摘要： Methods for correcting for aberrations in the image or three-dimensional reconstruction of a sampled region obtained by broadband interferometry. The sampled region is illuminated with a broadband beam of light, and light returned from the sample is detected, along with a reference beam, in order to derive an interference signal for pixels of a volume spanned by wavenumber and axes transverse to the beam propagation direction. An optimization procedure is performed with respect to a specified criterion so as to obtain an aberration-corrected image of at least one plane of the sampled region, either in a plane-specific manner or in a space-invariant manner throughout the sampled region. A filter function, which may be derived from the interference signal attendant to irradiating a sparsely distributed plurality of point scatterers, or otherwise, corrects for a detected aberrated point spread function. Methods of the present invention may be used for aberration correction in reading information from an optical data storage medium.
摘要翻译： 用于校正通过宽带干涉测量获得的采样区域的图像中的像差或三维重建的方法。 用宽带光束照射采样区域，并且与参考光束一起检测从样本返回的光，以便导出由波数和横向于光束传播方向的轴的像素的干涉信号 。 针对特定标准执行优化过程，以便在整个采样区域以平面特定的方式或以空间不变的方式获得采样区域的至少一个平面的像差校正图像。 可以从伴随照射稀疏分布的多个点散射体的干扰信号导出的滤波器功能，或以其他方式校正检测到的像差点扩展函数。 本发明的方法可以用于从光学数据存储介质读取信息中的像差校正。
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7.发明授权Second-order nonlinear susceptibility of a nanoparticle using coherent confocal microscopy 有权使用相干共焦显微镜的纳米颗粒的二阶非线性敏感性公开(公告)号：US08334976B2
公开(公告)日：2012-12-18
申请号：US13154014
申请日：2011-06-06
IPC分类号： G01N21/00
CPC分类号： G01N21/636 , G01N21/23 , G01N2021/4792 , G02B21/0056
摘要： A coherent confocal microscope and methods for measuring elements of the non-linear susceptibility of a nanoparticle, including, more particularly, all of the elements of the second-order susceptibility tensor of a single nanoparticle under permutation and Kleinman symmetry. Using a high numerical aperture lens, two-dimensional scanning and a vector beam shaper, the second-order nonlinear susceptibility is derived from a single confocal image. A forward model for the problem is presented and a computationally efficient data processing method robustly solves the inverse problem.
摘要翻译： 一种相干共焦显微镜和用于测量纳米颗粒的非线性磁化率的元素的方法，更具体地，包括在排列和克莱曼对称下的单个纳米颗粒的二阶磁敏度张量的所有元素。 使用高数值孔径透镜，二维扫描和矢量光束整形器，从单个共焦图像导出二阶非线性磁化率。 提出了一个问题的前向模型，并且计算效率高的数据处理方法可以很好地解决逆问题。
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8.发明授权Robust determination of the anisotropic polarizability of nanoparticles using coherent confocal microscopy 有权使用相干共聚焦显微镜稳定确定纳米粒子的各向异性极化率公开(公告)号：US08045161B2
公开(公告)日：2011-10-25
申请号：US12405711
申请日：2009-03-17
IPC分类号： G01N21/00
CPC分类号： G01N21/21 , G01N21/23 , G01N2021/4792 , G02B21/0056
摘要： A coherent confocal microscope for fully characterizing the elastic scattering properties of a nanoparticle as a function of wavelength. Using a high numerical aperture lens, two-dimensional scanning and a simple vector beam shaper, the rank-2 polarizability tensor is estimated from a single confocal image. A computationally efficient data processing method is described and numerical simulations show that this algorithm is robust to noise and uncertainty in the focal plane position. The measurement of the polarizability removes the need for a priori assumptions regarding the nanoparticle shape.
摘要翻译： 一种用于完全表征纳米颗粒的弹性散射性质作为波长的函数的相干共聚焦显微镜。 使用高数值孔径透镜，二维扫描和简单的矢量光束整形器，从单个共焦图像估计二阶极化率张量。 描述了计算有效的数据处理方法，数值模拟表明，该算法对焦平面位置的噪声和不确定性是鲁棒的。 极化率的测量消除了关于纳米颗粒形状的先验假设的需要。
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公开(公告)号：US07969650B2
公开(公告)日：2011-06-28
申请号：US11413633
申请日：2006-04-28
申请人： Daniel L. Marks , Paul Scott Carney
发明人： Daniel L. Marks , Paul Scott Carney
IPC分类号： G02B21/06
CPC分类号： G01Q30/04 , G01Q60/22 , G02B21/0064 , G02B21/0068
摘要： A near-field microscope using one or more diffractive elements placed in the near-field of an object to be imaged. A diffractive covers the entire object, thus signal may thereby be gathered from the entire object, and advantageously increase the signal-to-noise ratio of the resulting image, as well as greatly improve the acquisition speed. Near-field microscopy overcomes the limitation of conventional microscopy in that subwavelength and nanometer-scale features can be imaged and measured without contact.
摘要翻译： 一种近场显微镜，其使用放置在待成像对象的近场中的一个或多个衍射元件。 衍射覆盖整个物体，从而可以从整个物体收集信号，并且有利地增加了所得到的图像的信噪比，并且极大地提高了采集速度。 近场显微镜克服了常规显微镜的局限性，因为亚波长和纳米尺度的特征可以被成像和测量而没有接触。
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10.发明申请Nanoscale Optical Tomography Based on Volume-Scanning Near-Field Microscopy 有权基于体积扫描近场显微镜的纳米级光学层析成像公开(公告)号：US20100039654A1
公开(公告)日：2010-02-18
申请号：US12405449
申请日：2009-03-17
IPC分类号： G01B11/30
CPC分类号： G01Q60/22
摘要： An apparatus and methods for nanoscale optical tomography based on back-scattering mode near-field scanning optical microscopy with a volumetric scan of the probe. The back-scattered data collected by a volumetric scan of the probe contains three-dimensional structural information of the sample, which enables reconstruction of the dielectric sample without other mechanical movements of the instrument.
摘要翻译： 基于背散射模式近场扫描光学显微镜的纳米尺度光学层析成像的装置和方法，具有探针的体积扫描。 通过探针的体积扫描收集的背散射数据包含样品的三维结构信息，其能够重建电介质样品而无需仪器的其他机械运动。
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