公开(公告)号：US08334976B2

公开(公告)日：2012-12-18

申请号：US13154014

申请日：2011-06-06

申请人： Paul Scott Carney ,  Kimani C. Toussaint ,  Brynmor J. Davis ,  Santosh Tripathi

发明人： Paul Scott Carney ,  Kimani C. Toussaint ,  Brynmor J. Davis ,  Santosh Tripathi

IPC分类号： G01N21/00

CPC分类号： G01N21/636 ,  G01N21/23 ,  G01N2021/4792 ,  G02B21/0056

摘要： A coherent confocal microscope and methods for measuring elements of the non-linear susceptibility of a nanoparticle, including, more particularly, all of the elements of the second-order susceptibility tensor of a single nanoparticle under permutation and Kleinman symmetry. Using a high numerical aperture lens, two-dimensional scanning and a vector beam shaper, the second-order nonlinear susceptibility is derived from a single confocal image. A forward model for the problem is presented and a computationally efficient data processing method robustly solves the inverse problem.

摘要翻译： 一种相干共焦显微镜和用于测量纳米颗粒的非线性磁化率的元素的方法，更具体地，包括在排列和克莱曼对称下的单个纳米颗粒的二阶磁敏度张量的所有元素。 使用高数值孔径透镜，二维扫描和矢量光束整形器，从单个共焦图像导出二阶非线性磁化率。 提出了一个问题的前向模型，并且计算效率高的数据处理方法可以很好地解决逆问题。

公开(公告)号：US20230101629A1

公开(公告)日：2023-03-30

申请号：US17484315

申请日：2021-09-24

申请人： Bohan Shan ,  Dingying Xu ,  Kristof Darmawikarta ,  Srinivas Venkata Ramanuja Pietambaram ,  Hongxia Feng ,  Gang Duan ,  Jung Kyu Han ,  Xiaoying Guo ,  Jeremy D. Ecton ,  Santosh Tripathi ,  Bai Nie ,  Haobo Chen ,  Kyle Jordan Arrington ,  Yue Deng ,  Wei Wei

发明人： Bohan Shan ,  Dingying Xu ,  Kristof Darmawikarta ,  Srinivas Venkata Ramanuja Pietambaram ,  Hongxia Feng ,  Gang Duan ,  Jung Kyu Han ,  Xiaoying Guo ,  Jeremy D. Ecton ,  Santosh Tripathi ,  Bai Nie ,  Haobo Chen ,  Kyle Jordan Arrington ,  Yue Deng ,  Wei Wei

IPC分类号： H01L21/48 ,  H01L23/538 ,  H01L23/29 ,  H01L23/26 ,  H01L21/56 ,  H01L23/24

摘要： Various embodiments disclosed relate to methods of making omni-directional semiconductor interconnect bridges. The present disclosure includes semiconductor assemblies including a mold layer having mold material, a first filler material dispersed in the mold material, and a second filler material dispersed in the mold material, wherein the second filler material is heterogeneously dispersed.

公开(公告)号：US20110267617A1

公开(公告)日：2011-11-03

申请号：US13154014

申请日：2011-06-06

申请人： Paul Scott Carney ,  Kimani C. Toussaint ,  Brynmor J. Davis ,  Santosh Tripathi

发明人： Paul Scott Carney ,  Kimani C. Toussaint ,  Brynmor J. Davis ,  Santosh Tripathi

IPC分类号： G01N21/47 ,  G01J3/30

CPC分类号： G01N21/636 ,  G01N21/23 ,  G01N2021/4792 ,  G02B21/0056

摘要： A coherent confocal microscope and methods for measuring elements of the non-linear susceptibility of a nanoparticle, including, more particularly, all of the elements of the second-order susceptibility tensor of a single nanoparticle under permutation and Kleinman symmetry. Using a high numerical aperture lens, two-dimensional scanning and a vector beam shaper, the second-order nonlinear susceptibility is derived from a single confocal image. A forward model for the problem is presented and a computationally efficient data processing method robustly solves the inverse problem.

摘要翻译： 一种相干共焦显微镜和用于测量纳米颗粒的非线性磁化率的元素的方法，更具体地，包括在排列和克莱曼对称下的单个纳米颗粒的二阶磁敏度张量的所有元素。 使用高数值孔径透镜，二维扫描和矢量光束整形器，从单个共焦图像导出二阶非线性磁化率。 提出了一个问题的前向模型，并且计算效率高的数据处理方法可以很好地解决逆问题。