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公开(公告)号：US06204680B1
公开(公告)日：2001-03-20
申请号：US09139543
申请日：1998-08-25
IPC分类号： G01R3102
CPC分类号： G01R1/06722 , G01R1/0483
摘要： A test socket for an integrated circuit package having an upper housing and a lower housing secured to the top and bottom surfaces, respectively, of a load board. The upper housing having a cavity for receipt of the integrated circuit package and including a hole in the base of the upper housing to allow a plurality of solid socket plungers to contact test sites on the integrated circuit package. The socket plungers are positioned within a plurality of channels formed in the lower housing and extend through a plurality of holes in the load board to contact the test sites. A plurality of springs are positioned in the channels of the lower housing below the socket plungers to provide a spring force to bias the socket plungers upwardly toward the integrated circuit package. A nonconductive pushrod is positioned between the spring and a beveled edge of the plunger and a nonconductive cap is positioned above the load board for high frequency test signals. For closely spaced test sites a thinner daughter board is electrically connected to the load board through a hole in the load board. The test socket is then positioned on the daughter board.
摘要翻译： 一种用于集成电路封装的测试插座，其具有分别固定到负载板的顶表面和底表面的上壳体和下壳体。 上壳体具有用于接收集成电路封装的空腔，并且在上壳体的基部中包括孔，以允许多个实心插座柱塞接触集成电路封装上的测试位置。 插座柱塞定位在形成在下壳体中的多个通道内并且延伸穿过负载板中的多个孔以接触测试位置。 多个弹簧定位在下壳体的通道内，位于插座柱塞下方，以提供弹簧力，以将插座柱塞向上朝向集成电路封装偏置。 非导电推杆位于弹簧和柱塞的斜边之间，并且非导电帽位于负载板上方以用于高频测试信号。 对于紧密间隔的测试位置，较薄的子板通过负载板上的孔与负载板电连接。 然后将测试插座定位在子板上。
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公开(公告)号：US07605583B2
公开(公告)日：2009-10-20
申请号：US11874603
申请日：2007-10-18
申请人： Roy W. Green , Mark A. Bradford , Davis S. Dao , Trung Van Nguyen , James M. Ogg
发明人： Roy W. Green , Mark A. Bradford , Davis S. Dao , Trung Van Nguyen , James M. Ogg
IPC分类号： G01R31/02
CPC分类号： G01R31/2889
摘要： An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the peripheral system, a second unit having a second connection member for providing electrical communication with the test system, and pivot members coupling the first unit and the second unit. The pivot members enable motion in the following sequence as one of the first and second unit moves towards the other: a) pivotal motion between the first connection member and the second connection member; and b) linear motion which decreases linear distance between the first connection member and the second connection member while maintaining respective contact surfaces of the first and second connection members in parallel.
摘要翻译： 提供了一种用于将测试头连接到外围系统的装置。 该装置包括具有用于与周边系统电连通的第一连接构件的第一单元，具有用于与测试系统进行电连通的第二连接构件的第二单元和联接第一单元和第二单元的枢转构件。 当第一和第二单元中的一个向另一个移动时，枢转构件使得能够按照以下顺序运动：a）第一连接构件和第二连接构件之间的枢转运动; 以及b）直线运动，其减小所述第一连接构件和所述第二连接构件之间的直线距离，同时保持所述第一和第二连接构件的各个接触表面平行。
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公开(公告)号：US20080258713A1
公开(公告)日：2008-10-23
申请号：US11874603
申请日：2007-10-18
申请人： Roy W. GREEN , Mark A. BRADFORD , Davis S. DAO , Trung Van NGUYEN , James M. OGG
发明人： Roy W. GREEN , Mark A. BRADFORD , Davis S. DAO , Trung Van NGUYEN , James M. OGG
IPC分类号： G01R1/02
CPC分类号： G01R31/2889
摘要： An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the peripheral system, a second unit having a second connection member for providing electrical communication with the test system, and pivot members coupling the first unit and the second unit. The pivot members enable motion in the following sequence as one of the first and second unit moves towards the other: a) pivotal motion between the first connection member and the second connection member; and b) linear motion which decreases linear distance between the first connection member and the second connection member while maintaining respective contact surfaces of the first and second connection members in parallel.
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公开(公告)号：US07301326B1
公开(公告)日：2007-11-27
申请号：US11199646
申请日：2005-08-09
申请人： Roy W. Green , Mark A. Bradford , Davis S. Dao , Trung Van Nguyen , James M. Ogg
发明人： Roy W. Green , Mark A. Bradford , Davis S. Dao , Trung Van Nguyen , James M. Ogg
CPC分类号： G01R31/2889
摘要： An apparatus for interfacing a test head to a peripheral system is provided. The apparatus includes a first unit having a first connection member for providing electrical communication with the peripheral system, a second unit having a second connection member for providing electrical communication with the test system, and pivot members coupling the first unit and the second unit. The pivot members enable motion in the following sequence as one of the first and second unit moves towards the other: a) pivotal motion between the first connection member and the second connection member; and b) linear motion which decreases linear distance between the first connection member and the second connection member while maintaining respective contact surfaces of the first and second connection members in parallel.
摘要翻译： 提供了一种用于将测试头连接到外围系统的装置。 该装置包括具有用于与周边系统电连通的第一连接构件的第一单元，具有用于与测试系统进行电连通的第二连接构件的第二单元和联接第一单元和第二单元的枢转构件。 当第一和第二单元中的一个向另一个移动时，枢转构件使得能够按照以下顺序运动：a）第一连接构件和第二连接构件之间的枢转运动; 以及b）直线运动，其减小所述第一连接构件和所述第二连接构件之间的直线距离，同时保持所述第一和第二连接构件的各个接触表面平行。
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