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公开(公告)号：US20100223515A1
公开(公告)日：2010-09-02
申请号：US12063156
申请日：2006-08-09
申请人： Andre Krijn Nieuwland , Sandeepkumar Goel , Erik Jan Marinissen , Hubertus Gerardus Hendrikus Vermeulen , Hendrikus Petrus Elisabeth Vranken
发明人： Andre Krijn Nieuwland , Sandeepkumar Goel , Erik Jan Marinissen , Hubertus Gerardus Hendrikus Vermeulen , Hendrikus Petrus Elisabeth Vranken
IPC分类号： G01R31/3177 , G06F11/25
CPC分类号： G01R31/318541 , G01R31/31719
摘要： An integrated circuit (10) comprises a scan chain (14) with parallel inputs and outputs coupled to a functional circuit (12a-c). A scan chain modifying circuit (43, 47, 70a-c) is provided coupled to the scan chain (14). When testing is authorized the scan chain modifying circuit operates in a mode wherein a normal shift path is provided through the scan chain. When testing is not authorized the scan chain modifying circuit (43, 47, 70a-c) operates to effect spontaneous dynamic changes in the shift path, which dynamically vary the length of the shift path between external terminals of the integrated circuit while shifting takes place. In an embodiment the dynamical variations are controlled by a running key comparison. In other embodiments running key comparison is used to disable transfer through the scan chain and/or operation of functional circuits.
摘要翻译： 集成电路（10）包括具有耦合到功能电路（12a-c）的并行输入和输出的扫描链（14）。 提供耦合到扫描链（14）的扫描链修改电路（43,47,70a-c）。 当授权测试时，扫描链修改电路以通过扫描链提供正常移位路径的模式工作。 当测试不被授权时，扫描链修改电路（43,47,70a-c）操作以实现移位路径中的自发动态变化，其在移位期间动态地改变集成电路的外部端子之间的移位路径的长度 。 在一个实施例中，通过运行的密钥比较来控制动态变化。 在其他实施例中，运行密钥比较用于禁止通过扫描链的转移和/或功能电路的操作。
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公开(公告)号：US20100231252A1
公开(公告)日：2010-09-16
申请号：US12160409
申请日：2007-01-05
IPC分类号： G01R31/26
CPC分类号： G01R31/31715 , G01R31/31723 , G01R31/318569 , G01R31/318572
摘要： An integrated circuit (200) comprises a functional block (130) conductively coupled to a supply rail (110) via one or more switches (115). The IC further comprises selection means (220) responsive to a test enable signal for activating the one or more switches (115) in a test mode of the IC and evaluation means such as a comparator (230) having a first input coupled to a reference signal source (215) and having a second input coupled to a node (225) between the one or more switches (115) and the functional block (130) for evaluating the behaviour of the one or more switches (115) based on the reference signal and a signal from the node (225). Thus, the present invention provides a design for testability solution for testing power switches.
摘要翻译： 集成电路（200）包括经由一个或多个开关（115）导电耦合到电源轨（110）的功能块（130）。 IC还包括响应于在IC的测试模式下激活一个或多个开关（115）的测试使能信号的选择装置（220）和诸如比较器（230）的评估装置，该比较器具有耦合到参考的第一输入 信号源（215）并且具有耦合到所述一个或多个开关（115）和所述功能块（130）之间的节点（225）的第二输入，用于基于所述参考来评估所述一个或多个开关（115）的行为 信号和来自节点（225）的信号。 因此，本发明提供了用于测试功率开关的可测试性解决方案的设计。
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公开(公告)号：US08539292B2
公开(公告)日：2013-09-17
申请号：US12063156
申请日：2006-08-09
申请人： André K. Nieuwland , Sandeepkumar Goel , Erik J. Marinissen , Hubertus G. H. Vermeulen , Hendrikus P. E. Vranken
发明人： André K. Nieuwland , Sandeepkumar Goel , Erik J. Marinissen , Hubertus G. H. Vermeulen , Hendrikus P. E. Vranken
CPC分类号： G01R31/318541 , G01R31/31719
摘要： An integrated circuit comprises a scan chain with parallel inputs and outputs coupled to a functional circuit. A scan chain modifying circuit is provided coupled to the scan chain. When testing is authorized the scan chain modifying circuit operates in a mode wherein a normal shift path is provided through the scan chain. When testing is not authorized the scan chain modifying circuit operates to effect spontaneous dynamic changes in the shift path, which dynamically vary the length of the shift path between external terminals of the integrated circuit while shifting takes place. In an embodiment the dynamical variations are controlled by a running key comparison. In other embodiments running key comparison is used to disable transfer through the scan chain or operation of functional circuits.
摘要翻译： 集成电路包括具有耦合到功能电路的并行输入和输出的扫描链。 提供耦合到扫描链的扫描链修改电路。 当授权测试时，扫描链修改电路以通过扫描链提供正常移位路径的模式工作。 当测试不被授权时，扫描链修改电路操作以实现移位路径中的自发动态变化，其在发生移位时动态地改变集成电路的外部端子之间的移位路径的长度。 在一个实施例中，通过运行的密钥比较来控制动态变化。 在其他实施例中，运行密钥比较用于禁止通过扫描链的转移或功能电路的操作。
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公开(公告)号：US20100264932A1
公开(公告)日：2010-10-21
申请号：US12063151
申请日：2006-08-09
申请人： Erik Jan Marinissen , Sandeepkumar Goel , Andre Krijn Nieuwland , Hubertus Gerardus Hendrikus Vermeulen , Hendrikus Petrus Elisabeth Vranken
发明人： Erik Jan Marinissen , Sandeepkumar Goel , Andre Krijn Nieuwland , Hubertus Gerardus Hendrikus Vermeulen , Hendrikus Petrus Elisabeth Vranken
IPC分类号： G01R31/02
CPC分类号： G01R31/31719 , G01R31/318533
摘要： An integrated circuit (10) comprises a functional circuit (12a-c) that contain information that must be secured against unauthorized access. The integrated circuit comprises a test access circuit (14, 16) coupled to the functional circuit (12a-c), and a plurality of fuse elements (18) coupled to the test access circuit (14, 16). The fuse elements (18) are connected in a circuit configuration that makes the functional circuit (12a-c) consistently accessible via the test access circuit (14, 16) only when first fuse elements (18) of the plurality are in a blown state and second fuse elements (18) of the plurality are in a not-blown state. As a result the integrated circuit can be tested after selectively blowing all of the first fuse elements (18). After testing at least part of the second fuse elements (18) is blown. As a result, a person that does not know which fuse elements are first fuse elements and which are second fuse elements is presented with difficulties to restore the integrated circuit to a state where test access with the danger of access to the secured information is possible.
摘要翻译： 集成电路（10）包括功能电路（12a-c），其包含必须防止未授权访问的信息。 集成电路包括耦合到功能电路（12a-c）的测试访问电路（14,16）和耦合到测试访问电路（14,16）的多个熔丝元件（18）。 保险丝元件（18）以仅在多个第一熔丝元件（18）处于吹制状态时通过测试存取电路（14,16）可一致地访问的电路配置连接 并且多个的第二熔丝元件（18）处于未吹塑状态。 结果，可以在选择性地吹扫所有第一熔丝元件（18）之后测试集成电路。 在测试之后，至少部分第二熔丝元件（18）被吹塑。 结果，不知道哪些熔丝元件是第一熔丝元件并且是第二熔丝元件的人被呈现难以将集成电路恢复到具有访问安全信息的危险的测试访问是可能的状态。
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