Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains
    2.
    发明授权
    Methods for analyzing scan chains, and for determining numbers or locations of hold time faults in scan chains 有权
    分析扫描链以及确定扫描链中保持时间故障数量或位置的方法

    公开(公告)号:US08010856B2

    公开(公告)日:2011-08-30

    申请号:US12058768

    申请日:2008-03-31

    IPC分类号: G01R31/28

    CPC分类号: G01R31/318536

    摘要: In a method for determining a number of possible hold time faults in a scan chain of a DUT, an environmental variable of the scan chain is set to a value believed to cause a hold time fault in the scan chain, and then a pattern is shifted through the scan chain. The pattern has a background pattern of at least n contiguous bits of a first logic state, followed by at least one bit of a second logic state, where n is a length of the scan chain. The number of possible hold time faults in the scan chain can be determined as a difference between i) a clock cycle when the at least one bit is expected to cause a transition at an output of the scan chain, and ii) a clock cycle when the at least one bit actually causes a transition at the output of the scan chain. If a value of the environmental variable at which the scan chain operates correctly can be determined, the location of one or more hold time faults can also be determined.

    摘要翻译: 在用于确定DUT的扫描链中可能的保持时间故障的数量的方法中,扫描链的环境变量被设置为被认为在扫描链中引起保持时间故障的值,然后模式被移位 通过扫描链。 该模式具有第一逻辑状态的至少n个连续位的后台模式,随后是第二逻辑状态的至少一位,其中n是扫描链的长度。 扫描链中可能的保持时间故障的数量可以被确定为i)当预期至少一个位导致扫描链的输出处的转变时的时钟周期之间的差异,以及ii)时钟周期 至少一个位实际上在扫描链的输出端引起转换。 如果可以确定扫描链正确操作的环境变量的值,则也可以确定一个或多个保持时间故障的位置。

    METHODS FOR ANALYZING SCAN CHAINS, AND FOR DETERMINING NUMBERS OR LOCATIONS OF HOLD TIME FAULTS IN SCAN CHAINS
    3.
    发明申请
    METHODS FOR ANALYZING SCAN CHAINS, AND FOR DETERMINING NUMBERS OR LOCATIONS OF HOLD TIME FAULTS IN SCAN CHAINS 有权
    用于分析扫描链的方法,以及用于确定扫描链中保持时间故障的数字或位置

    公开(公告)号:US20090113263A1

    公开(公告)日:2009-04-30

    申请号:US12058768

    申请日:2008-03-31

    IPC分类号: G01R31/3177 G06F11/25

    CPC分类号: G01R31/318536

    摘要: In a method for determining a number of possible hold time faults in a scan chain of a DUT, an environmental variable of the scan chain is set to a value believed to cause a hold time fault in the scan chain, and then a pattern is shifted through the scan chain. The pattern has a background pattern of at least n contiguous bits of a first logic state, followed by at least one bit of a second logic state, where n is a length of the scan chain. The number of possible hold time faults in the scan chain can be determined as a difference between i) a clock cycle when the at least one bit is expected to cause a transition at an output of the scan chain, and ii) a clock cycle when the at least one bit actually causes a transition at the output of the scan chain. If a value of the environmental variable at which the scan chain operates correctly can be determined, the location of one or more hold time faults can also be determined.

    摘要翻译: 在用于确定DUT的扫描链中可能的保持时间故障的数量的方法中,扫描链的环境变量被设置为被认为在扫描链中引起保持时间故障的值,然后模式被移位 通过扫描链。 该模式具有第一逻辑状态的至少n个连续位的后台模式,随后是第二逻辑状态的至少一位,其中n是扫描链的长度。 扫描链中可能的保持时间故障的数量可以被确定为i)当预期至少一个位导致扫描链的输出处的转变时的时钟周期之间的差异,以及ii)时钟周期 至少一个位实际上在扫描链的输出端引起转换。 如果可以确定扫描链正确操作的环境变量的值,则也可以确定一个或多个保持时间故障的位置。