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公开(公告)号:US08633558B2
公开(公告)日:2014-01-21
申请号:US12981640
申请日:2010-12-30
申请人: Ta-Hsuan Lin , Chuan-Jin Shiu , Chia-Ming Cheng , Tsang-Yu Liu
发明人: Ta-Hsuan Lin , Chuan-Jin Shiu , Chia-Ming Cheng , Tsang-Yu Liu
IPC分类号: H01L31/0216 , H01L31/18
CPC分类号: H01L27/14618 , H01L21/76898 , H01L23/055 , H01L23/16 , H01L27/14683 , H01L31/0203 , H01L2924/0002 , H01L2924/00
摘要: The embodiment provides a package structure for a chip and a method for fabricating the same. The package structure for the chip includes a chip having a substrate and a bonding pad structure. The chip has an upper surface and a lower surface. An upper packaging layer covers the upper surface of the chip. A spacer layer is between the upper packaging layer and the chip. A conductive path is electrically connected to the bonding pad structure. An anti-reflective layer is disposed between the spacer layer and the upper packaging layer. An overlapping region is between the anti-reflective layer and the spacer layer.
摘要翻译: 该实施例提供了用于芯片的封装结构及其制造方法。 用于芯片的封装结构包括具有衬底和焊盘结构的芯片。 该芯片具有上表面和下表面。 上包装层覆盖芯片的上表面。 间隔层位于上包装层和芯片之间。 导电路径电连接到接合焊盘结构。 防反射层设置在间隔层和上包装层之间。 重叠区域在抗反射层和间隔层之间。
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公开(公告)号:US20110156191A1
公开(公告)日:2011-06-30
申请号:US12981640
申请日:2010-12-30
申请人: Ta-Hsuan LIN , Chuan-Jin SHIU , Chia-Ming CHENG , Tsang-Yu LIU
发明人: Ta-Hsuan LIN , Chuan-Jin SHIU , Chia-Ming CHENG , Tsang-Yu LIU
IPC分类号: H01L31/0216 , H01L31/18
CPC分类号: H01L27/14618 , H01L21/76898 , H01L23/055 , H01L23/16 , H01L27/14683 , H01L31/0203 , H01L2924/0002 , H01L2924/00
摘要: The embodiment provides a package structure for a chip and a method for fabricating the same. The package structure for the chip includes a chip having a substrate and a bonding pad structure. The chip has an upper surface and a lower surface. An upper packaging layer covers the upper surface of the chip. A spacer layer is between the upper packaging layer and the chip. A conductive path is electrically connected to the bonding pad structure. An anti-reflective layer is disposed between the spacer layer and the upper packaging layer. An overlapping region is between the anti-reflective layer and the spacer layer.
摘要翻译: 该实施例提供了用于芯片的封装结构及其制造方法。 用于芯片的封装结构包括具有衬底和焊盘结构的芯片。 该芯片具有上表面和下表面。 上包装层覆盖芯片的上表面。 间隔层位于上包装层和芯片之间。 导电路径电连接到接合焊盘结构。 防反射层设置在间隔层和上包装层之间。 重叠区域在抗反射层和间隔层之间。
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