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    METHOD FOR MANUFACTURING ORGANIC SEMICONDUCTOR THIN FILM AND MONOCRYASTALLINE ORGANIC SEMICONDUCTOR THIN FILM
    1.
    发明申请
    METHOD FOR MANUFACTURING ORGANIC SEMICONDUCTOR THIN FILM AND MONOCRYASTALLINE ORGANIC SEMICONDUCTOR THIN FILM 有权
    制造有机半导体薄膜和单晶有机半导体薄膜的方法

    公开(公告)号：US20130149811A1

    公开(公告)日：2013-06-13

    申请号：US13816999

    申请日：2011-08-10

    申请人： Tatsuo Hasegawa ,  Hiromi Minemawari ,  Toshikazu Yamada ,  Hiroyuki Matsui

    发明人： Tatsuo Hasegawa ,  Hiromi Minemawari ,  Toshikazu Yamada ,  Hiroyuki Matsui

    IPC分类号： H01L51/00

    CPC分类号： H01L51/0002 ,  C09D11/322 ,  C09D11/52 ,  H01L51/0005 ,  H01L51/0007 ,  H01L51/0094

    摘要： The first object of the present invention is to provide a method for manufacturing a uniform organic semiconductor thin film consisting of single organic molecule with extremely few pinholes and of which both quality and thickness are uniform when the organic semiconductor thin film is manufactured by printing process. The second object of the present invention is to manufacture a monocrystalline organic semiconductor of which almost the entire region consists of a single monocrystal, by printing process.The uniform organic semiconductor thin film is manufactured by steps of: preparing a first ink obtained by dissolving a high concentration of the organic semiconductor in an organic solvent with high affinity for the organic semiconductor, and a second ink consisting of an organic solvent having a low affinity for the organic semiconductor; mixing the first and second inks on a substrate by simultaneously or alternately discharging the first and second inks from each ink head. Furthermore, a shape on which a seed crystal is generated with highly efficiency in one portion of a region storing the ink and a monocrystal is grown over the almost entire region storing the ink from the shape as a starting point.

    摘要翻译： 本发明的第一个目的是提供一种制造均匀的有机半导体薄膜的方法，该有机半导体薄膜由具有极少针孔的单一有机分子组成，并且当通过印刷方法制造有机半导体薄膜时，其质量和厚度均匀。 本发明的第二个目的是通过印刷方法制造几乎整个区域由单一单晶构成的单晶有机半导体。 均匀的有机半导体薄膜是通过以下步骤制造的：制备通过将有机半导体的高浓度溶解在有机半导体中具有高亲和力的有机溶剂中获得的第一种油墨和由有机半导体的有机溶剂组成的第二种油墨 对有机半导体的亲和力; 通过从每个墨头同时或交替地排放第一和第二墨水将第一和第二墨水混合在基底上。 此外，从存储油墨的区域的一部分和单晶中以高效率生成晶种的形状生长在从形状为起点的存储油墨的几乎整个区域上。

    Method for manufacturing organic semiconductor thin film and monocryastalline organic semiconductor thin film
    2.
    发明授权
    Method for manufacturing organic semiconductor thin film and monocryastalline organic semiconductor thin film 有权
    制造有机半导体薄膜和单壳菌素有机半导体薄膜的方法

    公开(公告)号：US09059407B2

    公开(公告)日：2015-06-16

    申请号：US13816999

    申请日：2011-08-10

    申请人： Tatsuo Hasegawa ,  Hiromi Minemawari ,  Toshikazu Yamada ,  Hiroyuki Matsui

    发明人： Tatsuo Hasegawa ,  Hiromi Minemawari ,  Toshikazu Yamada ,  Hiroyuki Matsui

    IPC分类号： H01L51/40 ,  H01L51/00 ,  C09D11/322 ,  C09D11/52

    CPC分类号： H01L51/0002 ,  C09D11/322 ,  C09D11/52 ,  H01L51/0005 ,  H01L51/0007 ,  H01L51/0094

    摘要： A method for manufacturing a uniform organic semiconductor thin film consisting of single organic molecule with extremely few pinholes and of which both quality and thickness are uniform when the organic semiconductor thin film is manufactured by printing process. The uniform organic semiconductor thin film is manufactured by steps of: preparing a first ink obtained by dissolving a high concentration of the organic semiconductor in an organic solvent with high affinity for the organic semiconductor, and a second ink consisting of an organic solvent having a low affinity for the organic semiconductor; mixing the first and second inks on a substrate by simultaneously or alternately discharging the first and second inks from each ink head.

    摘要翻译： 一种制造均匀的有机半导体薄膜的方法，所述均匀的有机半导体薄膜由具有极少针孔的单一有机分子组成，并且当通过印刷方法制造有机半导体薄膜时，质量和厚度均匀。 均匀的有机半导体薄膜是通过以下步骤制造的：制备通过将有机半导体的高浓度溶解在有机半导体中具有高亲和力的有机溶剂中获得的第一种油墨和由有机半导体的有机溶剂组成的第二种油墨 对有机半导体的亲和力; 通过从每个墨头同时或交替地排放第一和第二墨水将第一和第二墨水混合在基底上。

    Method of judging hydrogen embrittlement cracking of material used in high-temperature, high-pressure hydrogen environment
    6.
    发明授权
    Method of judging hydrogen embrittlement cracking of material used in high-temperature, high-pressure hydrogen environment 有权
    判断在高温，高压氢环境中使用的材料的氢脆裂纹的方法

    公开(公告)号：US07035746B2

    公开(公告)日：2006-04-25

    申请号：US10880616

    申请日：2004-07-01

    申请人： Yoru Wada ,  Tatsuo Hasegawa ,  Rinzo Kayano ,  Hirokazu Inoue

    发明人： Yoru Wada ,  Tatsuo Hasegawa ,  Rinzo Kayano ,  Hirokazu Inoue

    IPC分类号： G01N37/00 ,  G06F19/00

    CPC分类号： G01N33/20 ,  G01N2203/006 ,  G01N2203/0066

    摘要： Using information about the position, orientation, and shape of a crack appeared in a judged material and information about the structure of the judged material as parameters, the stress intensity factor KI of the crack is found. Based on the stress intensity factor KI, hydrogen embrittlement cracking of the judged material is judged. The crack growth rate and possibility of brittle fracture can be judged by comparing the stress intensity factor KI with the critical stress intensity factor KIH for crack initiation or the critical stress intensity factor KIC-H for brittle fracture about the temper embrittled steel which absorbs approximately 2.0 ppm hydrogen.

    摘要翻译： 在判断材料中出现关于裂纹的位置，取向和形状的信息，以及关于判断材料的结构的信息作为参数的信息，发现裂纹的应力强度因子K I I。 基于应力强度因子KI判断判定材料的氢脆裂纹。 裂纹扩展速率和脆性断裂的可能性可以通过将应力强度因子K I I与用于裂纹开始的临界应力强度因子K 或临界应力强度 关于吸收约2.0ppm氢气的回火脆化钢的脆性断裂的因子K <！ - SIPO

    Method of judging hydrogen embrittlement cracking of material used in high-temperature, high-pressure hydrogen environment
    7.
    发明申请
    Method of judging hydrogen embrittlement cracking of material used in high-temperature, high-pressure hydrogen environment 有权
    判断在高温，高压氢环境中使用的材料的氢脆裂纹的方法

    公开(公告)号：US20050028882A1

    公开(公告)日：2005-02-10

    申请号：US10880616

    申请日：2004-07-01

    申请人： Yoru Wada ,  Tatsuo Hasegawa ,  Rinzo Kayano ,  Hirokazu Inoue

    发明人： Yoru Wada ,  Tatsuo Hasegawa ,  Rinzo Kayano ,  Hirokazu Inoue

    IPC分类号： G01N17/00 ,  F16L9/14 ,  G01N3/00 ,  G01N33/20

    CPC分类号： G01N33/20 ,  G01N2203/006 ,  G01N2203/0066

    摘要： Using information about the position, orientation, and shape of a crack appeared in a judged material and information about the structure of the judged material as parameters, the stress intensity factor KI of the crack is found. Based on the stress intensity factor KI, hydrogen embrittlement cracking of the judged material is judged. The crack growth rate and possibility of brittle fracture can be judged by comparing the stress intensity factor KI with the critical stress intensity factor KIH for crack initiation or the critical stress intensity factor KIC-H for brittle fracture about the temper embrittled steel which absorbs approximately 2.0 ppm hydrogen.

    摘要翻译： 使用关于判定材料的位置，取向和形状的信息，将关于判定材料的结构的信息作为参数出现，找到裂纹的应力强度因子KI。 基于应力强度因子KI，判断判断材料的氢脆裂纹。 通过将应力强度因子KI与裂纹开始的临界应力强度因子KIH或吸收约2.0的回火脆化钢的脆性断裂的临界应力强度因子KIC-H进行比较，可以判断裂纹扩展速度和脆性断裂的可能性 ppm氢气。

    Automatic chemical analyzer
    8.
    发明授权
    Automatic chemical analyzer 失效
    自动化学分析仪

    公开(公告)号：US4155978A

    公开(公告)日：1979-05-22

    申请号：US898858

    申请日：1978-04-21

    申请人： Toyohiko Naono ,  Tatsuo Hasegawa

    发明人： Toyohiko Naono ,  Tatsuo Hasegawa

    IPC分类号： G01N33/483 ,  G01N35/00 ,  G01N33/16 ,  G01N1/14

    CPC分类号： G01N35/00

    摘要： An automatic chemical analyzer comprising an extractor for extracting the desired sample from a plurality of liquid samples, a measuring valve for measuring out a fixed quantity of the extracted sample, a plurality of reagent storage tanks each storing a different kind of reagent according to the analysis intended, a plurality of reagent pumps equal in number to the number of reagent storage tanks, each of said plurality of reagent pumps being connected to each of said plurality of reagent storage tanks for drawing the reagents out of the reagent storage tanks, a reaction device comprising a plurality of reaction tubes for containing the samples and reagents, a reagent selector located between the pumps and the reaction device, said selector connecting a specific reagent pump to the reaction device according to the type of analysis.

    摘要翻译： 一种自动化学分析装置，包括从多个液体样品提取所需样品的提取器，用于测量固定量的提取样品的测量阀，根据分析存储不同种类的试剂的多个试剂储存罐 目的是与试剂储存罐的数量相等的多个试剂泵，所述多个试剂泵中的每一个连接到所述多个试剂储存罐中的每一个，用于将试剂从试剂储存罐中抽出;反应装置 包括多个用于容纳样品和试剂的反应管，位于泵和反应装置之间的试剂选择器，所述选择器根据分析类型将特定试剂泵连接到反应装置。