公开(公告)号：US07865795B2

公开(公告)日：2011-01-04

申请号：US12039292

申请日：2008-02-28

申请人： Thomas Nirmaier ,  Wolfgang Spirkl

发明人： Thomas Nirmaier ,  Wolfgang Spirkl

IPC分类号： G01R31/28 ,  G06F11/00

CPC分类号： G11C29/56 ,  G01R31/318357 ,  G01R31/318385 ,  G11C29/56004

摘要： Methods and apparatuses for generating a random sequence of commands for a semiconductor device. The method generates random state transitions within a finite state machine model of the semiconductor device. A sequence of commands is determined which are associated to the generated random state transitions based on the finite state machine model of the semiconductor device.

摘要翻译： 用于产生用于半导体器件的随机指令序列的方法和装置。 该方法在半导体器件的有限状态机模型内产生随机状态转换。 基于半导体器件的有限状态机模型，确定与生成的随机状态转换相关联的命令序列。

公开(公告)号：US20150012238A1

公开(公告)日：2015-01-08

申请号：US14495962

申请日：2014-09-25

申请人： Georg Pelz ,  Thomas Nirmaier

发明人： Georg Pelz ,  Thomas Nirmaier

IPC分类号： G01R31/26

CPC分类号： G01R31/2601 ,  G01R31/2879 ,  G01R31/2894 ,  H01L22/14 ,  H01L22/20

摘要： A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.

摘要翻译： 一种用于确定电子部件的操作参数值的测试集合的方法，所述方法包括：确定第一组中间集合，每个中间集合包含电子部件的第一数量的操作参数的组合; 确定第二组参考集合，其中所述第二集合包含集合的并集，每个集合包括用于各个中间集合的参数的参数值的所有可能组合; 从一组预定义集合中选择具有第二数量的测试集的第三集合，其中每个预定义集合包括来自所述预定参数集的所有参数的参数值的不同组合，使得所述第二集合是 每个集合包括相应测试集合的所有参数的第一数量的参数值的所有可能组合。

公开(公告)号：US08868371B2

公开(公告)日：2014-10-21

申请号：US13228504

申请日：2011-09-09

申请人： Georg Pelz ,  Thomas Nirmaier

发明人： Georg Pelz ,  Thomas Nirmaier

IPC分类号： G01R31/00 ,  H01L21/66 ,  G01R31/28

CPC分类号： G01R31/2601 ,  G01R31/2879 ,  G01R31/2894 ,  H01L22/14 ,  H01L22/20

摘要： A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.

摘要翻译： 一种用于确定电子部件的操作参数值的测试集合的方法，所述方法包括：确定第一组中间集合，每个中间集合包含电子部件的第一数量的操作参数的组合; 确定第二组参考集合，其中所述第二集合包含集合的并集，每个集合包括用于各个中间集合的参数的参数值的所有可能组合; 从一组预定义集合中选择具有第二数量的测试集的第三集合，其中每个预定义集合包括来自所述预定参数集的所有参数的参数值的不同组合，使得所述第二集合是 每个集合包括相应测试集合的所有参数的第一数量的参数值的所有可能组合。

公开(公告)号：US20130066582A1

公开(公告)日：2013-03-14

申请号：US13228504

申请日：2011-09-09

申请人： Georg Pelz ,  Thomas Nirmaier

发明人： Georg Pelz ,  Thomas Nirmaier

IPC分类号： G06F19/00 ,  G01R31/00

CPC分类号： G01R31/2601 ,  G01R31/2879 ,  G01R31/2894 ,  H01L22/14 ,  H01L22/20

摘要： A method for determining test sets of operating parameter values for an electronic component, the method including: determining a first set of intermediate sets, each intermediate set containing a combination of a first number of operating parameters of the electronic component; determining a second set of reference sets, wherein the second set contains a union of sets, each set comprising all possible combinations of parameter values for the parameters of a respective intermediate set; selecting a third set with a second number of test sets out of a set of predefined sets, wherein each predefined set comprises a different combination of the parameter values for all parameters from the predefined parameter set, such that the second set is a subset of a union of a number of sets, each set comprising all possible combinations of the first number of parameter values for all parameters of a respective test set.

公开(公告)号：US20090222779A1

公开(公告)日：2009-09-03

申请号：US12039292

申请日：2008-02-28

申请人： Thomas Nirmaier ,  Wolfgang Spirkl

发明人： Thomas Nirmaier ,  Wolfgang Spirkl

IPC分类号： G06F17/50 ,  G06F11/00

CPC分类号： G11C29/56 ,  G01R31/318357 ,  G01R31/318385 ,  G11C29/56004

摘要： Methods and apparatuses for generating a random sequence of commands for a semiconductor device. The method generates random state transitions within a finite state machine model of the semiconductor device. A sequence of commands is determined which are associated to the generated random state transitions based on the finite state machine model of the semiconductor device.

摘要翻译： 用于产生用于半导体器件的随机指令序列的方法和装置。 该方法在半导体器件的有限状态机模型内产生随机状态转换。 基于半导体器件的有限状态机模型，确定与生成的随机状态转换相关联的命令序列。

公开(公告)号：US20060150047A1

公开(公告)日：2006-07-06

申请号：US11027918

申请日：2004-12-30

申请人： Wolfgang Nikutta ,  Thomas Nirmaier

发明人： Wolfgang Nikutta ,  Thomas Nirmaier

IPC分类号： G01R31/28 ,  G06F11/00

CPC分类号： G01R31/31928 ,  G01R31/31922

摘要： An apparatus for generating an output signal having a higher frequency than a first signal received from a first external connector of a test equipment associated to a first channel and a second signal received on a second external connector of the test equipment associated to a second channel, having a first connector adapted to be connected to said first external connector, and adapted to receive the first signal, a second connector adapted to be connected to said second external connector, and adapted to receive the second signal, wherein the first and second signals are out of phase, an output to be connected to the device under test, and a passive circuit for combining the signals received at said first and second connector into the output signal and for providing said output signal to said output.

摘要翻译： 一种用于产生具有比从与第一通道相关联的测试设备的第一外部连接器接收的第一信号更高的频率的输出信号的设备和在与第二通道相关联的测试设备的第二外部连接器上接收的第二信号， 具有适于连接到所述第一外部连接器并适于接收第一信号的第一连接器，适于连接到所述第二外部连接器并适于接收第二信号的第二连接器，其中第一和第二信号是 与被测设备连接的输出端以及将在所述第一和第二连接器处接收的信号组合成输出信号并将所述输出信号提供给所述输出端的无源电路。