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公开(公告)号：US10744714B2
公开(公告)日：2020-08-18
申请号：US15542379
申请日：2015-04-30
Applicant: HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P. , Miguel Angel Lopez , Raul Rodriguez Alonso , Xavier Quintero Ruiz
Inventor： Miguel Angel Lopez , Raul Rodriguez Alonso , Xavier Quintero Ruiz
IPC: B29C64/165 , B29C64/386 , B29C64/112 , B33Y50/02 , B29C64/393
Abstract: Misalignments of a 3d printing device may be detected by providing a reference pattern in a print zone of the 3d printing device, wherein the reference pattern comprises a plurality of reference marks, printing a test pattern on the reference pattern by means of the 3d printing device, and comparing the test pattern with the reference marks.
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公开(公告)号：US20180036949A1
公开(公告)日：2018-02-08
申请号：US15542379
申请日：2015-04-30
Applicant: Miguel Angel LOPEZ , Raul RODRIGUEZ AL , Xavier QUINTERO RUIZ , HEWLETT-PACKARD DEVELOPMENT COMPANY, L.P.
Inventor： Miguel Angel Lopez , Raul Rodriguez Alonso , Xavier Quintero Ruiz
IPC: B29C64/393 , B22F3/00 , B28B1/00 , B33Y30/00 , B33Y50/02 , B29C64/165
Abstract: Misalignments of a 3d printing device may be detected by providing a reference pattern in a print zone of the 3d printing device, wherein the reference pattern comprises a plurality of reference marks, printing a test pattern on the reference pattern by means of the 3d printing device, and comparing the test pattern with the reference marks.
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公开(公告)号：US20170225499A1
公开(公告)日：2017-08-10
申请号：US15502302
申请日：2014-08-25
Inventor： Xavier Quintero Ruiz , David Gaston Llado
IPC: B41J29/393
CPC classification number: B41J29/393 , B41J2/2132
Abstract: According to one example, there is provided a method of determining an alignment characteristic of a printhead die installed in a printer. The method comprises controlling the printer to print a predetermined pattern using the printhead die and determining, through analysis of the distance between features of the printed predetermined pattern, alignment characteristics of the printhead die.
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