Low-K dielectric structure and method
    1.
    发明授权
    Low-K dielectric structure and method 有权
    低K电介质结构及方法

    公开(公告)号:US07294934B2

    公开(公告)日:2007-11-13

    申请号:US10301957

    申请日:2002-11-21

    IPC分类号: H01L23/52

    摘要: A low-k dielectric sacrificial material is formed within a microelectronic structure covered with a suitable porous or low density permeable material. At an appropriate time, the underlying sacrificial material is decomposed and diffused away through the overlying permeable material. As a result, at least one void is created, contributing to desirable dielectric characteristics.

    摘要翻译: 在由适当的多孔或低密度可渗透材料覆盖的微电子结构内形成低k电介质牺牲材料。 在适当的时间,潜在的牺牲材料通过上覆的可渗透材料分解和扩散。 结果,产生至少一个空隙,有助于所需的介电特性。