Oxygen-rich layers underlying BPSG
    1.
    发明申请
    Oxygen-rich layers underlying BPSG 有权
    BPSG底层富氧层

    公开(公告)号:US20080283933A1

    公开(公告)日:2008-11-20

    申请号:US11803437

    申请日:2007-05-15

    摘要: An integrated circuit structure and a method of forming the same are provided. The method includes providing a surface; performing an ionized oxygen treatment to the surface; forming an initial layer comprising silicon oxide using first process gases comprising a first oxygen-containing gas and tetraethoxysilane (TEOS); and forming a silicate glass over the initial layer. The method may further include forming a buffer layer using second process gases comprising a second oxygen-containing gas and TEOS, wherein the first and the second process gases have different oxygen-to-TEOS ratio.

    摘要翻译: 提供集成电路结构及其形成方法。 该方法包括提供表面; 对表面进行电离氧处理; 使用包含第一含氧气体和四乙氧基硅烷(TEOS)的第一工艺气体形成包含氧化硅的初始层; 并在初始层上形成硅酸盐玻璃。 该方法可以进一步包括使用包含第二含氧气体和TEOS的第二工艺气体形成缓冲层,其中第一和第二工艺气体具有不同的氧与-TEOS比。

    Oxygen-Rich Layers Underlying BPSG
    2.
    发明申请
    Oxygen-Rich Layers Underlying BPSG 有权
    含氧丰富层BPSG

    公开(公告)号:US20120119303A1

    公开(公告)日:2012-05-17

    申请号:US13358365

    申请日:2012-01-25

    IPC分类号: H01L29/45 H01L29/78

    摘要: An integrated circuit structure and a method of forming the same are provided. The method includes providing a surface; performing an ionized oxygen treatment to the surface; forming an initial layer comprising silicon oxide using first process gases comprising a first oxygen-containing gas and tetraethoxysilane (TEOS); and forming a silicate glass over the initial layer. The method may further include forming a buffer layer using second process gases comprising a second oxygen-containing gas and TEOS, wherein the first and the second process gases have different oxygen-to-TEOS ratio.

    摘要翻译: 提供集成电路结构及其形成方法。 该方法包括提供表面; 对表面进行电离氧处理; 使用包含第一含氧气体和四乙氧基硅烷(TEOS)的第一工艺气体形成包含氧化硅的初始层; 并在初始层上形成硅酸盐玻璃。 该方法可以进一步包括使用包含第二含氧气体和TEOS的第二工艺气体形成缓冲层,其中第一和第二工艺气体具有不同的氧与-TEOS比。

    Oxygen-rich layers underlying BPSG
    3.
    发明授权
    Oxygen-rich layers underlying BPSG 有权
    BPSG底层富氧层

    公开(公告)号:US07741171B2

    公开(公告)日:2010-06-22

    申请号:US11803437

    申请日:2007-05-15

    IPC分类号: H01L21/8238

    摘要: An integrated circuit structure and a method of forming the same are provided. The method includes providing a surface; performing an ionized oxygen treatment to the surface; forming an initial layer comprising silicon oxide using first process gases comprising a first oxygen-containing gas and tetraethoxysilane (TEOS); and forming a silicate glass over the initial layer. The method may further include forming a buffer layer using second process gases comprising a second oxygen-containing gas and TEOS, wherein the first and the second process gases have different oxygen-to-TEOS ratio.

    摘要翻译: 提供集成电路结构及其形成方法。 该方法包括提供表面; 对表面进行电离氧处理; 使用包含第一含氧气体和四乙氧基硅烷(TEOS)的第一工艺气体形成包含氧化硅的初始层; 并在初始层上形成硅酸盐玻璃。 该方法可以进一步包括使用包含第二含氧气体和TEOS的第二工艺气体形成缓冲层,其中第一和第二工艺气体具有不同的氧与-TEOS比。

    Front derailleur for a bicycle
    4.
    发明授权
    Front derailleur for a bicycle 有权
    自行车前拨链器

    公开(公告)号:US06471610B1

    公开(公告)日:2002-10-29

    申请号:US09589208

    申请日:2000-06-07

    IPC分类号: F16H900

    摘要: The present invention discloses a front derailleur for a bicycle to shift a chain via a chain guide between at least two sprockets which are attached on a frame of the bicycle. The front derailleur includes a wire extending through a stopper which is attached on the frame of the bicycle for transmitting a tension. An actuating link is connected to the wire in response to the tension for driving the chain guide to shift the chain between the sprockets. A wire guide is mounted on a seat tube of the frame and connected with the wire between the stopper and the actuating link for straightening the wire substantially parallel to the seat tube, thereby reducing a friction between the wire and the stopper.

    摘要翻译: 本发明公开了一种用于自行车的前拨链器,用于在连接在自行车的框架上的至少两个链轮之间经由链条导轨移动链条。 前拨链器包括延伸穿过止动器的线,该止动器附接在自行车的框架上以传递张力。 响应于用于驱动链条引导件以在链轮之间移动链条的张力,致动连杆连接到线材。 线引导件安装在框架的座管上并与止动器和致动连杆之间的线连接,用于使基本平行于座管的线矫直,从而减少线与止动器之间的摩擦。

    Oxygen-Rich Layers Underlying BPSG
    5.
    发明申请
    Oxygen-Rich Layers Underlying BPSG 有权
    含氧丰富层BPSG

    公开(公告)号:US20100221887A1

    公开(公告)日:2010-09-02

    申请号:US12779810

    申请日:2010-05-13

    IPC分类号: H01L21/336

    摘要: An integrated circuit structure and a method of forming the same are provided. The method includes providing a surface; performing an ionized oxygen treatment to the surface; forming an initial layer comprising silicon oxide using first process gases comprising a first oxygen-containing gas and tetraethoxysilane (TEOS); and forming a silicate glass over the initial layer. The method may further include forming a buffer layer using second process gases comprising a second oxygen-containing gas and TEOS, wherein the first and the second process gases have different oxygen-to-TEOS ratio.

    摘要翻译: 提供集成电路结构及其形成方法。 该方法包括提供表面; 对表面进行电离氧处理; 使用包含第一含氧气体和四乙氧基硅烷(TEOS)的第一工艺气体形成包含氧化硅的初始层; 并在初始层上形成硅酸盐玻璃。 该方法可以进一步包括使用包含第二含氧气体和TEOS的第二工艺气体形成缓冲层,其中第一和第二工艺气体具有不同的氧与-TEOS比。

    Oxygen-rich layers underlying BPSG
    6.
    发明授权
    Oxygen-rich layers underlying BPSG 有权
    BPSG底层富氧层

    公开(公告)号:US08759952B2

    公开(公告)日:2014-06-24

    申请号:US13358365

    申请日:2012-01-25

    IPC分类号: H01L23/58

    摘要: An integrated circuit structure and a method of forming the same are provided. The method includes providing a surface; performing an ionized oxygen treatment to the surface; forming an initial layer comprising silicon oxide using first process gases comprising a first oxygen-containing gas and tetraethoxysilane (TEOS); and forming a silicate glass over the initial layer. The method may further include forming a buffer layer using second process gases comprising a second oxygen-containing gas and TEOS, wherein the first and the second process gases have different oxygen-to-TEOS ratio.

    摘要翻译: 提供集成电路结构及其形成方法。 该方法包括提供表面; 对表面进行电离氧处理; 使用包含第一含氧气体和四乙氧基硅烷(TEOS)的第一工艺气体形成包含氧化硅的初始层; 并在初始层上形成硅酸盐玻璃。 该方法可以进一步包括使用包含第二含氧气体和TEOS的第二工艺气体形成缓冲层,其中第一和第二工艺气体具有不同的氧与-TEOS比。

    Oxygen-rich layers underlying BPSG
    7.
    发明授权
    Oxygen-rich layers underlying BPSG 有权
    BPSG底层富氧层

    公开(公告)号:US08114741B2

    公开(公告)日:2012-02-14

    申请号:US12779810

    申请日:2010-05-13

    IPC分类号: H01L21/336

    摘要: An integrated circuit structure and a method of forming the same are provided. The method includes providing a surface; performing an ionized oxygen treatment to the surface; forming an initial layer comprising silicon oxide using first process gases comprising a first oxygen-containing gas and tetraethoxysilane (TEOS); and forming a silicate glass over the initial layer. The method may further include forming a buffer layer using second process gases comprising a second oxygen-containing gas and TEOS, wherein the first and the second process gases have different oxygen-to-TEOS ratio.

    摘要翻译: 提供集成电路结构及其形成方法。 该方法包括提供表面; 对表面进行电离氧处理; 使用包含第一含氧气体和四乙氧基硅烷(TEOS)的第一工艺气体形成包含氧化硅的初始层; 并在初始层上形成硅酸盐玻璃。 该方法可以进一步包括使用包含第二含氧气体和TEOS的第二工艺气体形成缓冲层,其中第一和第二工艺气体具有不同的氧与-TEOS比。