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公开(公告)号：US20100077600A1
公开(公告)日：2010-04-01
申请号：US12559327
申请日：2009-09-14
申请人： Takateru Seki , Zhou Wenjun , Kazuo Takeda , Takefumi Kubota
发明人： Takateru Seki , Zhou Wenjun , Kazuo Takeda , Takefumi Kubota
CPC分类号： G11B5/3166 , G11B5/3169 , G11B5/3173 , G11B5/3906 , Y10T29/49036 , Y10T29/49041 , Y10T29/49043 , Y10T29/49044 , Y10T29/49046 , Y10T29/49048 , Y10T29/49052
摘要： According to one embodiment, a method for manufacturing a thin film magnetic head includes forming on a substrate magnetic head portions having a magnetoresistive element and resistance detection elements for measuring an amount of polishing; slicing the substrate to form at least one row bar; polishing the ABS of each row bar; forming rails on the polished ABS; and cutting each row bar to separate each magnetic head portion. The step of polishing the ABS includes measuring a resistance of each resistance detection element and a resistance of each magnetoresistive element; calculating an offset value between the resistance detection element and the magnetoresistive element; and calculating a final resistance of the resistance detection element by using the calculated offset value. When the resistance of the resistance detection element reaches the final resistance, polishing of the ABS of the row bar is terminated. Other methods are presented as well.
摘要翻译： 根据一个实施例，一种制造薄膜磁头的方法包括在基板上形成具有磁阻元件的磁头部分和用于测量抛光量的电阻检测元件; 将基板切片以形成至少一排排条; 抛光每排行的ABS; 在抛光ABS上形成轨道; 并切割每个行条以分离每个磁头部分。 抛光ABS的步骤包括测量每个电阻检测元件的电阻和每个磁阻元件的电阻; 计算电阻检测元件和磁阻元件之间的偏移值; 以及通过使用所计算的偏移值来计算电阻检测元件的最终电阻。 当电阻检测元件的电阻达到最终电阻时，排列的ABS的抛光结束。 还提出了其他方法。
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公开(公告)号：US08407882B2
公开(公告)日：2013-04-02
申请号：US12559327
申请日：2009-09-14
申请人： Takateru Seki , Zhou Wenjun , Kazuo Takeda , Takefumi Kubota
发明人： Takateru Seki , Zhou Wenjun , Kazuo Takeda , Takefumi Kubota
CPC分类号： G11B5/3166 , G11B5/3169 , G11B5/3173 , G11B5/3906 , Y10T29/49036 , Y10T29/49041 , Y10T29/49043 , Y10T29/49044 , Y10T29/49046 , Y10T29/49048 , Y10T29/49052
摘要： According to one embodiment, a method for manufacturing a thin film magnetic head includes forming on a substrate magnetic head portions having a magnetoresistive element and resistance detection elements for measuring an amount of polishing; slicing the substrate to form at least one row bar; polishing the ABS of each row bar; forming rails on the polished ABS; and cutting each row bar to separate each magnetic head portion. The step of polishing the ABS includes measuring a resistance of each resistance detection element and a resistance of each magnetoresistive element; calculating an offset value between the resistance detection element and the magnetoresistive element; and calculating a final resistance of the resistance detection element by using the calculated offset value. When the resistance of the resistance detection element reaches the final resistance, polishing of the ABS of the row bar is terminated. Other methods are presented as well.
摘要翻译： 根据一个实施例，一种制造薄膜磁头的方法包括在基板上形成具有磁阻元件的磁头部分和用于测量抛光量的电阻检测元件; 将基板切片以形成至少一排排条; 抛光每排行的ABS; 在抛光ABS上形成轨道; 并切割每个行条以分离每个磁头部分。 抛光ABS的步骤包括测量每个电阻检测元件的电阻和每个磁阻元件的电阻; 计算电阻检测元件和磁阻元件之间的偏移值; 以及通过使用所计算的偏移值来计算电阻检测元件的最终电阻。 当电阻检测元件的电阻达到最终电阻时，排列的ABS的抛光结束。 还提出了其他方法。
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