公开(公告)号：US20190188001A1

公开(公告)日：2019-06-20

申请号：US15846781

申请日：2017-12-19

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Amitabh MEHRA ,  Krishna SAI BERNUCHO

IPC: G06F9/44

CPC classification number: G06F9/4408 ,  G06F9/4403

Abstract: A computing device includes a processor having a plurality of cores, a core translation component, and a core assignment component. The core translation component provides a set of registers, one register for each core of the multiple processor cores. The core assignment component includes components to provide a core index to each of the registers of the core translation component according to a core assignment scheme during processor initialization. Process instructions from an operating system are transferred to a respective core based on the core indices.

公开(公告)号：US20190265767A1

公开(公告)日：2019-08-29

申请号：US15907744

申请日：2018-02-28

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Amitabh MEHRA ,  Dana G. LEWIS

IPC: G06F1/28 ,  G06F1/30 ,  G06F1/32

Abstract: A processor includes a plurality of voltage droop detectors positioned at multiple points of a processor. The detectors monitor voltage levels and alert the processor if a droop event has been detected in real time. Multiple droops can be detected simultaneously, with each detected droop event generating an alert that is sent to a processor module, such as a clock control module, to act based on the detected droop. Each detector employs a ring oscillator that generates a periodic signal and a corresponding count based on that signal, where the frequency of the signal varies based on a voltage at the corresponding point being monitored.

公开(公告)号：US20190310698A1

公开(公告)日：2019-10-10

申请号：US15949662

申请日：2018-04-10

Applicant: ADVANCED MICRO DEVICES, INC.

Inventor： Amitabh MEHRA

IPC: G06F1/32

Abstract: A monitoring system predicts voltage droops at a processor by monitoring one or more performance characteristics of the processor, selecting a response policy based on the prediction, and adjusting a parameter of the processor. Multiple predictions of voltage droop conditions at different locations of the processor are made simultaneously, with the processor generating one or more responses and resulting in adjusting one or more parameters of the processor. By predicting voltage droop conditions before they occur, the deleterious effects of such droop conditions can be minimized or avoided.