公开(公告)号：US20190011528A1

公开(公告)日：2019-01-10

申请号：US16128727

申请日：2018-09-12

Applicant: ALPS ELECTRIC CO., LTD.

Inventor： Keigo WAKANA ,  Daisuke TAKAI ,  Yukimitsu YAMADA ,  Toshiki NAKAMURA ,  Hironori TAKAYAMA

IPC: G01S5/14 ,  G01S13/76

Abstract: In a position detection system that has a plurality of transmitters/receivers placed at least three positions: processing is executed to measure distances among the plurality of transmitters/receivers, each distance being measured a plurality of times, and obtain a minimum value for each distance; processing is executed to obtain an angle between each two adjacent straight lines, each of which is one of straight lines that mutually connect the plurality of transmitters/receivers, by using minimum values, each of which is the minimum value for each distance; and if the absolute value of the difference between 180 degrees and the sum of angles, each of which is the angle between each two adjacent straight lines, inside a triangle formed by straight lines that interconnect three of the plurality of transmitters/receivers is smaller than a predetermined value, processing is executed to take the minimum values as the true values of the distances.

公开(公告)号：US20190011527A1

公开(公告)日：2019-01-10

申请号：US16127613

申请日：2018-09-11

Applicant: ALPS ELECTRIC CO., LTD.

Inventor： Keigo WAKANA ,  Daisuke TAKAI ,  Yukimitsu YAMADA ,  Toshiki NAKAMURA ,  Hironori TAKAYAMA

IPC: G01S5/14 ,  G01S5/02

CPC classification number: G01S5/14 ,  G01S5/0215 ,  G01S5/0252 ,  G01S5/0284

Abstract: A position detection system performs first through third processes to measure, using high-frequency signals, a position of a slave device in a measurement area surrounded by parent devices. The first process measures distances between the slave device and each of the master devices a plurality of times, to obtain a minimum value of each of the distances. The second process obtains a position of an intersection point of two arcs among arcs respectively having the minimum value of each of the distances as a radius from respective centers of the master devices when a number of intersection points of the two arcs within the measurement area is one. The third process regards a center of gravity of the intersection points as a true position of the slave device when the intersection points are densely arranged.